Jump to content

LabAdviser/Technology Research/Nanoscale characterization of ultra-thin metal films for nanofabrication applications: Difference between revisions

← Older editNewer edit →
VisualWikitext
Mattod (talk | contribs)
DCH-Employees-701
341 edits
Mattod (talk | contribs)
DCH-Employees-701
341 edits
Line 31: Line 31:




*; Organic ice resists for 3D electron-beam processing - Instrumentation and operation
*; Elevated temperature transmission Kikuchi diffraction in the SEM
*: [[File:Graphical Abstract.jpg|300px]]
*: [[[[:File:2.jpg|300px]]
*: [https://doi.org/10.1016/j.mee.2018.01.021 Link to Article]
*: [https://doi.org/10.1016/j.mee.2018.01.021 Link to Article]
*: <u>W. Tiddi</u>, A. Elsukova, M. Beleggia, and A. Han<br> ''Microelectronic Engineering'', vol. 192, pp. 38-43, 2018.
*: A. B. da Silva Fanta, <u>M. Todeschini</u>, A. Burrows, H. Jansen, C. D. Damsgaard, H. Alimadadi, and J. B. Wagner<br> ''Materials Characterization'', vol. 139, pp. 452-462, 2018.
** '''Overview:''' [[/SEM-LEO Customizations for Organic Ice Resists|SEM-LEO Customizations for Organic Ice Resists]]
** '''Overview:''' [[/SEM-LEO Customizations for Organic Ice Resists|SEM-LEO Customizations for Organic Ice Resists]]


Retrieved from "https://labadviser.nanolab.dtu.dk//index.php?title=LabAdviser/Technology_Research/Nanoscale_characterization_of_ultra-thin_metal_films_for_nanofabrication_applications"