LabAdviser/Technology Research/Nanoscale characterization of ultra-thin metal films for nanofabrication applications: Difference between revisions
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*: [[File:Graphical Abstract.gif|300px]] | *: [[File:Graphical Abstract.gif|300px]] | ||
*: [https://pubs.acs.org/doi/abs/10.1021/acsami.7b10136 Link to Article] | *: [https://pubs.acs.org/doi/abs/10.1021/acsami.7b10136 Link to Article] | ||
*: <u> | *: <u>M. Todeschini</u>, A. B. da Silva Fanta, F. Jensen, J. B. Wagner, and A. Han<br> ''ACS Appl. Mater. Interfaces'', vol. 9 (42), pp. 37374–37385, 2017. | ||
** '''Overview:''' [[/Electron-Beam Lithography on Organic Ice Resists|Electron-Beam Lithography on Organic Ice Resists]] | ** '''Overview:''' [[/Electron-Beam Lithography on Organic Ice Resists|Electron-Beam Lithography on Organic Ice Resists]] | ||