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*; Investigation with complementary characterization methods of adhesion layer effect on nanostructure of gold ultra-thin films
*; Investigation with complementary characterization methods of adhesion layer effect on nanostructure of gold ultra-thin films
*: <u>M. Todeschini</u>, J. B. Wagner, F. Jensen, A. Han<br> Abstract and Poster at at ''42nd International conference on Micro and Nano Engineering'', Vienna, Austria, 2016.
*: <u>M. Todeschini</u>, J. B. Wagner, F. Jensen, A. Han<br> Abstract and Poster at ''42nd International conference on Micro and Nano Engineering'', Vienna, Austria, 2016.


*; Atomic layer deposition instrument for in-situ environmental TEM imaging of ALD process  
*; Atomic layer deposition instrument for in-situ environmental TEM imaging of ALD process  
*: <u>W. Tiddi</u>, D. Zhao, M. Qiu, M. Beleggia, and A. Han<br> Abstract and Poster at ''42nd International conference on Micro and Nano Engineering'', Vienna, Austria, 2016.
*: <u>M. Todeschini</u>, P. Windmann, F. Jensen, J. B. Wagner, A. Han<br> Abstract and Poster at ''42nd International conference on Micro and Nano Engineering'', Vienna, Austria, 2016.


*; Ice lithography - water-based nanopatterning.
*; Adhesion layer investigation with complementary characterization methods for energy loss reduction in electronic nanodevices
*: <u>W. Tiddi</u>, M. Beleggia, and A. Han<br> Abstract and Poster at ''Sustain-ATV Conference 2016'', Kgs. Lyngby, Denmark, 2016.
*: <u>M. Todeschini</u>, A. B. da Silva Fanta, A. Burrows, J. B. Wagner, F. Jensen, A. Han<br> Abstract and Poster at ''Sustain-ATV Conference 2016'', Kgs. Lyngby, Denmark, 2016.
 
*; Proximity Effects in a Chemically Amplified Electron Beam Resist Patterned at 100 keV.
*: <u>W. Tiddi</u>, T. Greibe, M. Beleggia, and A. Han<br> Abstract and Poster at ''41st International conference on Micro and Nano Engineering'', The Hague, Netherlands, 2015.
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