Specific Process Knowledge/Etch/Etching of Chromium: Difference between revisions
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==Etching of Chromium== | ==Etching of Chromium== | ||
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Etching of chromium can be done either by wet etch, dry etch or by sputtering with ions. | Etching of chromium can be done either by wet etch, dry etch or by sputtering with ions. | ||
*[[Specific Process Knowledge/Etch/Wet Chromium Etch|Etching of Cr by wet etch]] | *[[Specific Process Knowledge/Etch/Wet Chromium Etch|Etching of Cr by wet etch]] | ||
*[[Specific Process Knowledge/Etch/ICP Metal Etcher/Chromium|Etching of Cr by | *[[Specific Process Knowledge/Etch/ICP Metal Etcher/Chromium|Etching of Cr by ICP metal]] | ||
*[[Specific_Process_Knowledge/Etch/IBE⁄IBSD Ionfab 300|Sputtering of Cr]] | *[[Specific_Process_Knowledge/Etch/IBE⁄IBSD Ionfab 300|Sputtering of Cr]] | ||
<br clear="all" /> | <br clear="all" /> | ||
==Comparison of Chromium Etch | ==Comparison of Chromium Etch Methods== | ||
{|border="1" cellspacing="1" cellpadding="3" style="text-align:left;" | {|border="1" cellspacing="1" cellpadding="3" style="text-align:left;" | ||
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! | ! | ||
![[Specific Process Knowledge/Etch/Wet Chromium Etch|Cr wet etch | ![[Specific Process Knowledge/Etch/Wet Chromium Etch|Cr wet etch]] | ||
![[Specific_Process_Knowledge/Etch/ICP_Metal_Etcher|ICP metal]] | ![[Specific_Process_Knowledge/Etch/ICP_Metal_Etcher|ICP metal]] | ||
![[Specific_Process_Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE (Ionfab300+)]] | ![[Specific_Process_Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE (Ionfab300+)]] | ||
![[Specific_Process_Knowledge/Etch/DRIE-Pegasus/Pegasus-2|DRIE-Pegasus 2]] | |||
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|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
! | !General description | ||
|Wet etch of Cr | |Wet etch of Cr premixed (Chrome etch 18) | ||
|Dry plasma etch of Cr | |Dry plasma etch of Cr | ||
|Sputtering of Cr - pure physical etch | |Sputtering of Cr - pure physical etch | ||
|Primarily shallow dry etching of silicon but also thin layers of SiO2, TaO2 and Cr | |||
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!Etch rate range | !Etch rate range | ||
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*~ | *~150nm/min at room temperature | ||
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*~14 nm/min (depending on features size and etch load) | *~14 nm/min (depending on features size and etch load) | ||
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*~30nm/min (not tested yet) | *~30nm/min (not tested yet) | ||
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* very slow | |||
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|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
!Etch profile | !Etch profile | ||
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*Isotropic | *Isotropic | ||
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*Anisotropic (angles sidewalls, typical around 70 dg) | *Anisotropic (angles sidewalls, typical around 70 dg) | ||
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*Anisotropic (vertical sidewalls) | |||
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*Any size and number that can go inside the beaker in use | *Any size and number that can go inside the beaker in use | ||
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* | * 150 mm wafers | ||
* Smaller wafers or pieces on a 150 mm carrier wafer | |||
* | |||
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Smaller pieces glued to carrier wafer | Smaller pieces glued to carrier wafer | ||
* | * 50mm wafer | ||
* | * 100mm wafer | ||
* | * 150mm wafer | ||
* | * 200mm wafer | ||
| | |||
* 150mm wafer | |||
* Smaller wafers or pieces on 150mm carrier | |||
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|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
! | !Allowed materials | ||
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No restrictions cross contamination wise as long as you use the right beaker and make sure that they are safe to enter in the chemicals | No restrictions cross contamination wise as long as you use the right beaker and make sure that they are safe to enter in the chemicals | ||
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*Polymers | *Polymers | ||
*Capton tape | *Capton tape | ||
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* Silicon | |||
* Silicon oxides | |||
* Silicon nitrides | |||
* Thin layers of Cr, TaO2 | |||
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|} | |} | ||