Specific Process Knowledge/Characterization/PL mapper: Difference between revisions
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==PhotoLuminescence Mapper: YWafer Mapper RD8-CP Photoluminescence | ==PhotoLuminescence Mapper: YWafer Mapper RD8-CP Photoluminescence== | ||
The PL mapper is used for non-destructive, spatially resolved optical characterization of wafers and thin-film samples. It is primarily used for photoluminescence mapping, but can also perform reflectance measurements using the integrated halogen lamp. | The PL mapper is used for non-destructive, spatially resolved optical characterization of wafers and thin-film samples. It is primarily used for photoluminescence mapping, but can also perform reflectance measurements using the integrated halogen lamp. | ||
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The user manual and contact information can be found in [http://www.labmanager.dtu.dk/function.php?module=Machine&view=view&mach= | The user manual and contact information can be found in [http://www.labmanager.dtu.dk/function.php?module=Machine&view=view&mach=574 '''LabManager''']. | ||
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==PhotoLuminescence Mapper RPM2000 == | ==PhotoLuminescence Mapper RPM2000 (This tool is not being serviced by DTU Nanolab anymore)== | ||
[[Image:PL-mapper.jpg|500px|right|thumb|Positioned in the MOCVD room: F-1, {{photo1}}]] | [[Image:PL-mapper.jpg|500px|right|thumb|Positioned in the MOCVD room: F-1, {{photo1}}]] | ||