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==PhotoLuminescence Mapper: YWafer Mapper RD8-CP Photoluminescence [[Image:section under construction.jpg|70px]]==
==PhotoLuminescence Mapper: YWafer Mapper RD8-CP Photoluminescence==


The PL mapper is used for non-destructive, spatially resolved optical characterization of wafers and thin-film samples. It is primarily used for photoluminescence mapping, but can also perform reflectance measurements using the integrated halogen lamp.
The PL mapper is used for non-destructive, spatially resolved optical characterization of wafers and thin-film samples. It is primarily used for photoluminescence mapping, but can also perform reflectance measurements using the integrated halogen lamp.
The PL mapper is a YWafer Mapper RD8-CP photoluminescence mapping system from YSystems, Japan. It contains an enclosed motorized mapping stage, laser excitation sources at 405, 532 and 980 nm, 310-2160 nm detection range, a halogen lamp for reflectance measurements, an integrated control PC, and safety interlocks. The system is operated using the YWaferController software.


The PL mapper is a YWafer Mapper RD8-CP photoluminescence mapping system from YSystems, Japan. It contains an enclosed motorized mapping stage, laser excitation sources at 405, 532 and 980 nm, 310-2160 nm detection range, a halogen lamp for reflectance measurements, an integrated control PC, and safety interlocks. The system is operated using the YWaferController software. For PL measurements, the system can map peak wavelength, peak amplitude, integrated intensity and FWHM. The software can also display PL data on a wavelength or energy scale. For reflectance measurements, the system can map reflectance-related parameters across the selected sample area.


'''Viewing software for download:''' .ywf map/spectra files can be viewed locally using the publicly available YWaferViewer software [https://www.ysystems.jp/en/component/edocman/public-downloads Here]


System: YWafer Mapper RD8-CP Photoluminescence Mapping System.
*System: YWafer Mapper RD8-CP Photoluminescence Mapping System.
Manufacturer: YSystems, Japan.
*Manufacturer: YSystems, Japan.
Full configuration: YWAFER-RD8-CP-VISNIR-QE-NIR22-405-532-980-FT-R-HAL.
*Full configuration: YWAFER-RD8-CP-VISNIR-QE-NIR22-405-532-980-FT-R-HAL.
Software: YWaferController for measurements, YWaferViewer for viewing maps and spectra and extracting data.
*Software: YWaferController for measurements, YWaferViewer for viewing maps and spectra and extracting data.




 
The user manual and contact information can be found in [http://www.labmanager.dtu.dk/function.php?module=Machine&view=view&mach=574 '''LabManager'''].
 
Minimum mapping resolution: 0.02 x 0.02 mm.
Spot size: Approx. 100 µm at ~1000 nm.
Reference: Permanent internal reference sample, referred to as “1080 nm ref”. The same reference sample can be found in the black suitcase on the side of the PL mapper.
 
The user manual and contact information can be found in [http://www.labmanager.dtu.dk/function.php?module=Machine&view=view&mach=152 '''LabManager'''].


{| border="2" cellspacing="0" cellpadding="10"  
{| border="2" cellspacing="0" cellpadding="10"  
|-
|-
!style="background:silver; color:black" align="left" rowspan="6" valign="top" |Performance
!style="background:silver; color:black" align="left" rowspan="4" valign="top" |Performance
|style="background:LightGrey; color:black"|Excitation
|style="background:LightGrey; color:black"|Excitation
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
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*Silicon detector range: 310-1080 nm.
*Silicon detector range: 310-1080 nm.
*IR/InGaAs detector range: 950-2160 nm.
*IR/InGaAs detector range: 950-2160 nm.
|-
|style="background:LightGrey; color:black"|Gratings
|style="background:WhiteSmoke; color:black"|
*600 lines/mm (single frame:  60 nm @ 400 nm)
*300 lines/mm (single frame: 120 nm @ 900 nm)
*150 lines/mm (single frame: 270 nm @ 1550 nm)
|-
|-
|style="background:LightGrey; color:black"|Sample/tray sizes
|style="background:LightGrey; color:black"|Sample/tray sizes
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
*2-inch, 4-inch, 2-inch quarter, 4-inch quarter, 40x40 mm, 76x26 mm (glass microscopy slide) and odd-sized samples smaller than 4-inch
*2-inch, 4-inch, 2-inch quarter, 4-inch quarter,  
*40x40 mm, 76x26 mm (glass microscopy slide)
*odd-sized samples smaller than 4-inch
|-
|-
|style="background:LightGrey; color:black"|Resolution
|style="background:LightGrey; color:black"|Resolution
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
* Minimum spatial resolution 100 µm
*Minimum mapping resolution: 0.02 x 0.02 mm.
* spotsize ~100 µm
*Spot size: Approx. 100 µm at ~1000 nm.
|-
|style="background:LightGrey; color:black"|Wavelength accuracy
|style="background:WhiteSmoke; color:black"|
* < +/- 1 nm
|-
|-
!style="background:silver; color:black" align="left" rowspan="2" valign="top" |Materials
!style="background:silver; color:black" align="left" rowspan="2" valign="top" |Materials
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|-
|-
!style="background:silver; color:black" align="left" rowspan="6" valign="top" |Software
!style="background:silver; color:black" align="left" rowspan="6" valign="top" |Software
|style="background:LightGrey; color:black"|RPM viewer
|style="background:LightGrey; color:black"|YWaferViewer
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
*Only on the local PC at the system
*.ywf map/spectra files can be viewed locally using the publicly available YWaferViewer software [https://www.ysystems.jp/en/component/edocman/public-downloads Here]
|}
|}


 
==PhotoLuminescence Mapper RPM2000 (This tool is not being serviced by DTU Nanolab anymore)==
 
For PL measurements, the system can map peak wavelength, peak amplitude, integrated intensity and FWHM. The software can also display PL data on a wavelength or energy scale. For reflectance measurements, the system can map reflectance-related parameters across the selected sample area.
 
==PhotoLuminescence Mapper RPM2000 ==


[[Image:PL-mapper.jpg|500px|right|thumb|Positioned in the MOCVD room: F-1, {{photo1}}]]
[[Image:PL-mapper.jpg|500px|right|thumb|Positioned in the MOCVD room: F-1, {{photo1}}]]
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