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Scanning Electron Microscopy (SEM) is a technique, where a focused beam of accelerated electrons is scanning over a sample. Electrons which are backscattered or secondary generated electrons are collected on a detector. Depending on the type of detector, different signals and sample characteristics can be acquired. The electron beam is steered by electromagnetic lenses.
Scanning Electron Microscopy (SEM) is a technique, where a focused beam of accelerated electrons is scanning over a sample. Electrons which are backscattered or secondary generated electrons are collected on a detector. Depending on the type of detector, different signals and sample characteristics can be acquired. The electron beam is steered by electromagnetic lenses.
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We have five SEMs available at DTU Nanolab in building 314/307. Click on the instrument to find more information about the equipment and available techniques:
 
We have five SEMs available at DTU Nanolab in building 314/307. Click on the instrument to find more information about the equipment and available techniques:
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