Specific Process Knowledge/Etch/DRIE-Pegasus/nanoetch/nano142-pxnano2: Difference between revisions
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'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Etch/DRIE-Pegasus/nanoetch/nano142-pxnano2 click here]''' | |||
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== nano1.42 versus pxnano2 == | == nano1.42 versus pxnano2 == | ||
| Line 9: | Line 17: | ||
! colspan="2"| Tool | ! colspan="2"| Tool | ||
| Pegasus | | Pegasus | ||
| colspan="2" | ASE | | colspan="2"| ASE | ||
|- | |- | ||
! rowspan="6" align="center"| Parameters | ! rowspan="6" align="center"| Parameters | ||
| Gas | | Gas | ||
| C<sub>4</sub>F<sub>8</sub> 75 sccm, SF<sub>6</sub> 38 sccm | | C<sub>4</sub>F<sub>8</sub> 75 sccm, SF<sub>6</sub> 38 sccm | ||
| D: C<sub>4</sub>F<sub>8</sub> 50 sccm | | D: C<sub>4</sub>F<sub>8</sub> 50 sccm | ||
| E: C<sub>4</sub>F<sub>8</sub> 50 sccm, SF<sub>6</sub> 50 sccm | |||
|- | |- | ||
| Power | | Power | ||
| Line 36: | Line 44: | ||
| Time | | Time | ||
| 120 secs | | 120 secs | ||
| colspan="2" | D: 3 secs, E: 5 secs, total 12 cycles | | colspan="2" | D: 3 secs, E: 5 secs, total 12 cycles or 96 secs | ||
|- | |- | ||
! rowspan="3" align="center"| Conditions | ! rowspan="3" align="center"| Conditions | ||
| Line 45: | Line 53: | ||
| Conditioning | | Conditioning | ||
| Sequence: Oxygen clean, MU tests, processes, no oxygen between runs | | Sequence: Oxygen clean, MU tests, processes, no oxygen between runs | ||
| colspan="2" | none | |||
|- | |- | ||
| Mask | | Mask | ||
| 211 nm zep etched down to | | 211 nm zep etched down to 80 nm | ||
| colspan="2" | 211 nm zep etched down to 130 nm | |||
|- | |- | ||
|} | |} | ||
<gallery caption="The results" widths="500" heights="350" perrow="2"> | <gallery caption="The results" widths="500" heights="350" perrow="2"> | ||
image:WF_2E09a_mar23_2011-030.jpg|The 30 nm trenches etched 120 seconds | image:WF_2E09a_mar23_2011-030.jpg|'''nano1.42:''' The 30 nm trenches etched 120 seconds | ||
image:WF_2E09b_mar23_2011-030.jpg|The 30 nm trenches etched 96 seconds | image:WF_2E09b_mar23_2011-030.jpg|'''pxnano2:''' The 30 nm trenches etched 96 seconds | ||
image:WF_2E09a_mar23_2011-060.jpg|The 60 nm trenches etched 120 seconds | image:WF_2E09a_mar23_2011-060.jpg|'''nano1.42:''' The 60 nm trenches etched 120 seconds | ||
image:WF_2E09b_mar23_2011-060.jpg|The 60 nm trenches etched 96 seconds | image:WF_2E09b_mar23_2011-060.jpg|'''pxnano2:''' The 60 nm trenches etched 96 seconds | ||
image:WF_2E09a_mar23_2011-090.jpg|The 90 nm trenches etched 120 seconds | image:WF_2E09a_mar23_2011-090.jpg|'''nano1.42:''' The 90 nm trenches etched 120 seconds | ||
image:WF_2E09b_mar23_2011-090.jpg|The 90 nm trenches etched 96 seconds | image:WF_2E09b_mar23_2011-090.jpg|'''pxnano2:''' The 90 nm trenches etched 96 seconds | ||
image:WF_2E09a_mar23_2011-120.jpg|The 120 nm trenches etched 120 seconds | image:WF_2E09a_mar23_2011-120.jpg|'''nano1.42:''' The 120 nm trenches etched 120 seconds | ||
image:WF_2E09b_mar23_2011-120.jpg|The 120 nm trenches etched 96 seconds | image:WF_2E09b_mar23_2011-120.jpg|'''pxnano2:''' The 120 nm trenches etched 96 seconds | ||
image:WF_2E09a_mar23_2011-150.jpg|The 150 nm trenches etched 120 seconds | image:WF_2E09a_mar23_2011-150.jpg|'''nano1.42:''' The 150 nm trenches etched 120 seconds | ||
image:WF_2E09b_mar23_2011-150.jpg|The 150 nm trenches etched 96 seconds | image:WF_2E09b_mar23_2011-150.jpg|'''pxnano2:''' The 150 nm trenches etched 96 seconds | ||
</gallery> | </gallery> | ||
{| {{table}} align="left" | |||
|+ nano1.42 on the Pegasus | |||
| align="center" style="background:#f0f0f0;"|'''Nominal trench line width''' | |||
| align="center" style="background:#f0f0f0;"|'''''' | |||
| align="center" style="background:#f0f0f0;"|'''30''' | |||
| align="center" style="background:#f0f0f0;"|'''60''' | |||
| align="center" style="background:#f0f0f0;"|'''90''' | |||
| align="center" style="background:#f0f0f0;"|'''120''' | |||
| align="center" style="background:#f0f0f0;"|'''150''' | |||
| align="center" style="background:#f0f0f0;"|'''Average''' | |||
| align="center" style="background:#f0f0f0;"|'''Std. dev.''' | |||
|- | |||
| Etch rates||nm/min||149||161||166||169||170||163||9 | |||
|- | |||
| Sidewall angle||degs||91||91||90||90||90||90||0 | |||
|- | |||
| CD loss||nm/edge||3||-11||-12||-34||-36||-18||17 | |||
|- | |||
| CD loss foot||nm/edge||9||1||1||-20||-9||-4||11 | |||
|- | |||
| Bowing||||4||4||2||6||2||4||2 | |||
|- | |||
| Bottom curvature||||-46||-40||-37||-31||-23||-35||9 | |||
|- | |||
| zep||nm/min||||||||||||66|| | |||
|- | |||
|} | |||
{| {{table}} align="center" | |||
|+ pxnano2 on the ASE | |||
| align="center" style="background:#f0f0f0;"|'''Nominal trench line width''' | |||
| align="center" style="background:#f0f0f0;"|'''''' | |||
| align="center" style="background:#f0f0f0;"|'''30''' | |||
| align="center" style="background:#f0f0f0;"|'''60''' | |||
| align="center" style="background:#f0f0f0;"|'''90''' | |||
| align="center" style="background:#f0f0f0;"|'''120''' | |||
| align="center" style="background:#f0f0f0;"|'''150''' | |||
| align="center" style="background:#f0f0f0;"|'''Average''' | |||
| align="center" style="background:#f0f0f0;"|'''Std. dev.''' | |||
|- | |||
| Etch rates||nm/min||215||232||240||243||244||235||12 | |||
|- | |||
| Sidewall angle||degs||90||89||89||89||89||89||0 | |||
|- | |||
| CD loss||nm/edge||1||-10||-11||-33||-33||-17||15 | |||
|- | |||
| CD loss foot||nm/edge||6||2||1||-19||-6||-3||10 | |||
|- | |||
| Bowing||||4||2||4||3||1||3||1 | |||
|- | |||
| Bottom curvature||||-36||-29||-22||-19||-17||-25||8 | |||
|- | |||
| zep||nm/min||||||||||||51|| | |||
|- | |||
| | |||
|} | |||