Specific Process Knowledge/Characterization/XRD/XRD SmartLab/Instrumental broading in GiXRD: Difference between revisions
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This page describes values of Instrumental broadening in GiXRD measurements, and can be used as a reference for peak broadening in 2θ - scans. | This page describes values of Instrumental broadening in [[Specific_Process_Knowledge/Characterization/XRD/Process_Info#2θ_scan._Graizing_Incident_X-ray_Diffraction_(GiXRD)|GiXRD measurements]], and can be used as a reference for peak broadening in 2θ - scans. The four most common slit configuration cases are chosen. | ||
The instrumental broadening has been measured by using standard Si powder sample. | The instrumental broadening has been measured by using standard Si powder sample. | ||
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λ is a wavelength of X-ray radiation (λ Cu-K<sub>α1</sub> = 1.540562 Å, and in case both Cu-K<sub>α1</sub> and Cu-K<sub>α2</sub> are present λ Cu-K<sub>α1,2</sub> = 1.541871 Å) <br> | λ is a wavelength of X-ray radiation (λ Cu-K<sub>α1</sub> = 1.540562 Å, and in case both Cu-K<sub>α1</sub> and Cu-K<sub>α2</sub> are present λ Cu-K<sub>α1,2</sub> = 1.541871 Å) <br> | ||
θ is Bragg angle <br> | θ is Bragg angle <br> | ||
β<sub>sample</sub> is a peak broadening. The technical point should be noted that | β<sub>sample</sub> is a peak broadening. The technical point should be noted that integral breadth and/or FWHM have to be inserted in radians.<br> | ||
<br clear="all" /> | <br clear="all" /> | ||