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Specific Process Knowledge/Characterization/XRD/XRD SmartLab/Instrumental broading in GiXRD: Difference between revisions

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This page describes values of Instrumental broadening in GiXRD measurements, and can be used as a reference for peak broadening in 2θ - scans. Most four common slit configuration cases are chosen.
This page describes values of Instrumental broadening in [[Specific_Process_Knowledge/Characterization/XRD/Process_Info#2θ_scan._Graizing_Incident_X-ray_Diffraction_(GiXRD)|GiXRD measurements]], and can be used as a reference for peak broadening in 2θ - scans. Most four common slit configuration cases are chosen.
The instrumental broadening has been measured by using standard Si powder sample.  
The instrumental broadening has been measured by using standard Si powder sample.  


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