Specific Process Knowledge/Characterization/XRD/XRD SmartLab/Instrumental broading in GiXRD: Difference between revisions
Created page with "This page describes values of Instrumental broadening in GiXRD measurements, and can be used as a reference for peak broadening in 2θ - scans. Most four common slit configuration cases are chosen. The instrumental broadening has been measured by using standard Si powder sample. Scherrer formula: <math>D=\frac{K\cdot\lambda}{\beta_{sample}\cdot cos\theta}</math> where: K is Scherrer constant (typically close to unity K=0.9-1)<br> λ is a wavelength of X-ray radiatio..." |
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This page describes values of Instrumental broadening in GiXRD measurements, and can be used as a reference for peak broadening in 2θ - scans. Most four common slit configuration cases are chosen. | '''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php?title=Specific_Process_Knowledge/Characterization/XRD/XRD_SmartLab/Instrumental_broading_in_GiXRD&action=submit click here]''' | ||
<i>This page is written by <b>Evgeniy Shkondin @DTU Nanolab</b> if nothing else is stated. <br> | |||
All images and photos on this page belongs to <b>DTU Nanolab</b>.<br> | |||
The fabrication and characterization described below were conducted in <b>2023 by Evgeniy Shkondin, DTU Nanolab</b>.<br></i> | |||
This page describes values of Instrumental broadening in [[Specific_Process_Knowledge/Characterization/XRD/Process_Info#2θ_scan._Graizing_Incident_X-ray_Diffraction_(GiXRD)|GiXRD measurements]], and can be used as a reference for peak broadening in 2θ - scans. Most four common slit configuration cases are chosen. | |||
The instrumental broadening has been measured by using standard Si powder sample. | The instrumental broadening has been measured by using standard Si powder sample. | ||