LabAdviser/314/Microscopy 314-307/TEM/T20/DF: Difference between revisions
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[[Category:314-Microscopy]] | [[Category:314-Microscopy]] | ||
<span style="background:#FF2800">THIS PAGE IS UNDER CONSTRUCTION</span>[[image:Under_construction.png|200px]] | |||
'''Diffraction Pattern:''' <br/> | '''Diffraction Pattern:''' <br/> | ||
This pattern provides the investigator with information about the space group symmetries in the crystal and the crystal's orientation with respect to the beam path. | This pattern provides the investigator with information about the space group symmetries in the crystal and the crystal's orientation with respect to the beam path. | ||