'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php?title=Specific_Process_Knowledge/Lithography/Coaters click here]'''
*All chemicals to be spray coated must be approved specifically for spray coating
*All chemicals to be spray coated must be approved specifically for spray coating
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=Spin coating=
=Spin coating=
The process of spin coating consists of a selection of the following steps:
The typical spin coating process consists of the following steps:
*Priming (typically HMDS)
#Priming (typically HMDS) followed by cooling to room temperature
*Acceleration to a low spin speed if dynamic dispense is used
#Resist dispense (rotation: static or dynamic rotation)(arm: stationary or moving)
*Resist dispense (static or dynamic)
#*Optional: Acceleration to a low spin speed if dynamic dispense is used
*Resist spreading at low spin speed
#*Optional: Resist spreading at low spin speed for spreading thicker resists
*Spin-off
#Spin-off
*Backside rinse (typically during spin-off)
#Backside rinse (typically during spin-off)
*Edge-bead removal
#Optional: Edge-bead removal
*Softbake (contact or proximity)
#Softbake (contact or proximity)
#Cooling to room temperature
After priming, the wafer is centered on the coater chuck and held in place by vacuum, or in some cases pins. If static dispense is used, the wafer remains static during the ensuing resist dispense. In the case of dynamic dispense, the wafer rotates at low spin speed during the dispense. Using too high spin speed during dispense can cause surface wetting issues, while a too low spin speed causes the resist to flow onto the backside of the wafer. After dispense, a short spin at low spin speed may be used in order to spread the resist over the wafer surface before spin-off.
After priming, the wafer is cooled to room temperature and then transferred to the spin coater. If static dispense is used, the wafer is not rotating during the resist dispense. In the case of dynamic dispense, the wafer rotates at low spin speed during the dispense. The dispense arm is normally stationary during dispense, but some substrates may require the arm to move slowly across the substrate area while dispensing. Moving arm dispensing is usually only done with a rotating substrate.
===Spin-off===
Using too high spin speed during dispense can cause surface wetting issues, while a too low spin speed causes the resist to flow onto the backside of the wafer. After dispense, a short spin at low spin speed may be used in order to spread the resist over the wafer surface before spin-off.
The spin-off cycle determines the thickness of the resist coating. For a given resist, the thickness is primarily a function of the spin-off speed and the spin-off time, both following an inverse power-law (y=k*x^-a). The acceleration to the spin-off speed also influences the thickness, but the effect is dependent on previous steps. The spin-off is usually a simple spin at one speed, but it may be comprised of several steps at different spin speeds. After spin-off, the wafer is decelerated.
The coated thickness, t, as a function of the spin-off speed, w, follows an inverse power-law, t = k * w<sup>-a</sup>. The constant, k, is a function of the resist viscosity and solid content, and the spin-off time. The exponent, a, is dependent on solvent evaporation, and is typically ~½ for UV resists. This means that from the thickness t<sub>1</sub> achieved at spin speed w<sub>1</sub>, one can estimate the spin speed w<sub>2</sub> needed to achieve thickness t<sub>2</sub> using the relation: <br> t<sub>1</sub>*w<sub>1</sub><sup>½</sup> = t<sub>2</sub>*w<sub>2</sub><sup>½</sup> => w<sub>2</sub> = w<sub>1</sub> * t<sub>1</sub><sup>2</sup>/t<sub>2</sub><sup>2</sup>. <br> For thick SU-8, however, a is observed to be ~1 (probably due to the low solvent content and/or the formation of skin). In this case, the relation simply becomes: <br> t<sub>1</sub>*w<sub>1</sub> = t<sub>2</sub>*w<sub>2</sub> => w<sub>2</sub> = w<sub>1</sub> * t<sub>1</sub>/t<sub>2</sub>. <br>
==Spin-off==
The spin-off cycle determines the thickness of the resist coating. For a given resist, the thickness is primarily a function of the spin-off speed and the spin-off time, both following an inverse power-law:
===Backside rinse===
<math>y = k \sdot x^{-a}</math>
Dependent on the spin speeds used in the various steps of the spin coating, resist may creep over the edge of the wafer and onto the backside. Also, some resists tend to leave fine strings of resist protruding from the edge of the wafer, or folded onto the backside, an effect sometimes referred to as "cotton candy". This resist will contaminate the softbake hotplate, and thus subsequent wafers with resist. In a backside rinse step, solvent administered through a nozzle to the backside of the wafer while spinning at low or medium spin speed dissolves the resist and washes it away. After the rinse, a short spin at medium spin speed dries the wafer before the softbake. During the backside rinse solvent inevitably creeps onto the front side of the wafer. This effect may be used to dissolve and subsequently remove an edge-bead, but it may also leave the rim of the wafer exposed. As an alternative to backside rinse, a wafer which is left dirty on the backside by the spin coat process may be softbaked in proximity in order to protect the hotplate from contamination. This leaves front side coating intact, but also leaves the backside dirty.
===Edge bead===
The acceleration to the spin-off speed also influences the thickness, but the effect is dependent on previous steps. The spin-off is usually a simple spin at one speed, but it may be comprised of several steps at different spin speeds. After spin-off, the wafer is decelerated.
During spin coating, resist builds up at the edge of the wafer due to the change in surface tension at the edge. This phenomenon is called an edge-bead. Dependent on spin coating parameters, the coating may be several times thicker at the edge than in the central area. In a subsequent hard contact exposure step, this edge-bead induces an undesired proximity gap which reduces the lateral resolution, and may even cause the wafer to stick to the mask.
In an edge-bead removal step, solvent administered through a nozzle positioned at the edge of the wafer while spinning at low or medium spin speed dissolves the resist and washes it away. After the removal, a short spin at medium spin speed dries the wafer before the softbake. Dependent on the viscosity (solvent content) of the resist at the point of edge-bead removal, this drying spin may cause the resist to re-flow and create a secondary edge-bead. In some cases, it may be necessary to (partially) softbake the resist before edge-bead removal.
The coated thickness, <math>t</math>, as a function of the spin-off speed, <math>w</math>, follows an inverse power-law:
===Softbake===
<math>t=k \sdot w^{-a}</math>
After spin coating, the solvent in the resist formulation must be evaporated in a baking step in order to solidify the resist. This softbake can be carried out as a contact bake or a proximity bake. In a contact bake, the wafer is held in close contact to the hotplate surface while resting on shallow bumps only 150µm above the hotplate. In a proximity bake, the wafer is first moved into proximity, e.g. 1mm, of the hotplate surface, then held there (on the lift pins) for the duration of the bake.
=Spin coaters at DTU Nanolab=
The constant, <math>k</math>, is a function of the resist viscosity and solid content, as well as the spin-off time. The exponent, <math>a</math>, is dependent on solvent evaporation, and is typically ~½ for UV resists. This means that from the thickness <math>t_1</math> achieved at spin speed <math>w_1</math>, one can estimate the spin speed <math>w_2</math> needed to achieve thickness <math>t_2</math> using the relation:
[[image:SpinCoaterGammaUV.jpg|400px|right|thumb|Spin Coater: Gamma UV in E-5]]
For thick SU-8, however, <math>a</math> is observed to be ~1 (probably due to the low solvent content and/or the formation of skin). In this case, the relation simply becomes:
'''Feedback to this section''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Lithography/Coaters#Spin_Coater:_Gamma_UV click here]'''
If the spin speed is too low during resist dispense, resist may creep over the edge of the wafer and onto the backside. Some resist tend to leave fine strings of resist protruding from the edge of the wafer, or folded onto the backside, an effect sometimes referred to as "cotton candy".
Spin Coater: Gamma UV was installed at DTU Nanolab in March 2015. It is a Gamma 2M cluster from Süss MicroTec with spin coating, vapour priming, and baking modules. The system handles 4" and 6" wafers without size conversion, and can be set up to handle 2" or 8".
Any resist on the edge and backside of the wafer will contaminate the end effector, softbake hotplate, and subsequent wafers.
The coater is equipped with 3 different resists lines:
In a backside rinse step, solvent administered through a nozzle to the backside of the wafer, while spinning at low or medium spin speed, dissolves the resist and washes it away. After the rinse, a short spin at medium spin speed dries the wafer before the softbake.
*AZ MiR 701
*AZ nLOF 2020
*AZ 5214E
and
*1 syringe, which can be used for various resists.
The processes that are available on the system are developed by Nanolab. Upon request, it is possible to establish new processes. Use of the syringe requires special training, and would as a starting point require batches in excess of 20 wafers.
During the backside rinse solvent inevitably creeps onto the front side of the wafer. This effect may be used to dissolve and subsequently remove an edge-bead, but it may also leave the rim of the wafer exposed. As an alternative to backside rinse, a wafer, which is contaminated on the backside, may be softbaked in proximity, in order to protect the hotplate from contamination. This leaves front side coating intact, but also leaves the backside dirty.
'''[https://www.youtube.com/watch?v=3JhM3rmLVpA Training video]'''
==Edge bead==
During spin coating, resist builds up at the edge of the wafer due to the change in surface tension at the edge, as well as extra drying from turbulence created by the wafer edge.
'''The user manual, quality control procedures and results, user APVs, and contact information can be found in [http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=359 LabManager]'''
This phenomenon is called edge-bead. Dependent on spin coating parameters, the coating may be several times thicker at the edge than in the central area. In a subsequent hard contact exposure step (mask aligner), this edge-bead introduces an undesired proximity gap, which reduces the lateral resolution, and may even cause the wafer to stick to the mask.
===[[Specific Process Knowledge/Lithography/Coaters/Spin Coater: Gamma UV processing|Process information]]===
In an edge-bead removal step, solvent administered through a nozzle positioned at the edge of the wafer, while spinning at low or medium spin speed, dissolves the resist and washes it away. After the removal, a short spin at medium spin speed dries the wafer before the softbake. Dependent on the viscosity (solvent content) of the resist after the edge-bead removal, this drying spin may cause the resist to re-flow and create a secondary edge-bead. In some cases, it may be necessary to (partially) softbake the resist before edge-bead removal.
[[Specific_Process_Knowledge/Lithography/Coaters/Spin_Coater:_Gamma_UV_processing#General_Process_Information|General Process Information]]
==Softbake==
After spin coating, the solvent in the resist must be evaporated in a baking step, in order to solidify the resist. This softbake can be carried out as a contact bake or a proximity bake. In a contact bake, the wafer is held in close contact to the hotplate surface, either in direct contact on the manual hotlpates or by resting on shallow bumps 150 µm above the hotplate in the Gamma tools. In a proximity bake, the wafer is first moved into proximity, e.g. 1mm, of the hotplate surface, then held there (on the lift pins) for the duration of the bake.
'''Feedback to this section''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Lithography/Coaters#Spin_Coater:_Gamma_E-beam_and_UV click here]'''
[[image:Gamma_4M_-_E-beam_&_UV_full.JPG|400px|right|thumb|Spin Coater: Gamma E-beam & UV in E-5]]
Spin Coater: Gamma E-beam and UV will be installed at DTU Nanolab in June 2017. It is a Gamma 4M cluster from Süss MicroTec with spin coating, vapour priming, and baking modules. The system handles 2", 4", and 6" wafers without size conversion, using two separate coater stations.
The 2" coater station is equipped with 2 different resists lines:
*AZ 5214E
*AR-P 6200.09 (CSAR)
and
*1 syringe, which can be used for various resists (anisole or PGMEA-based).
The 4"/6" coater station is equipped with 4 different resists lines:
*AZ 5214E
*AZ MiR 701
*AR-P 6200.09 (CSAR)
*AZ 4562
The processes that are available on the system are developed by Nanolab. Upon request, it is possible to establish new processes. Use of the syringe requires special training, and would as a starting point require batches in excess of 20 wafers.
'''[https://www.youtube.com/watch?v=3JhM3rmLVpA Training video]''' (for Spin Coater: Gamma UV)
'''The user manual, quality control procedures and results, user APVs, and contact information can be found in [http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=417 LabManager]'''
===Process information===
[[Specific Process Knowledge/Lithography/Coaters/Spin Coater: Gamma E-beam and UV processing|General Process information]]
*[[Specific_Process_Knowledge/Lithography/Coaters/Spin_Coater:_Gamma_E-beam_and_UV_processing#AZ_5214E_coating|AZ 5214E on Coater1 and Coater2]]
*[[Specific_Process_Knowledge/Lithography/Coaters/Spin_Coater:_Gamma_E-beam_and_UV_processing#AZ_MiR_701_.2829cps.29_coating|AZ MiR 701 on Coater2]]
*[[Specific_Process_Knowledge/Lithography/Coaters/Spin_Coater:_Gamma_E-beam_and_UV_processing#AR-P_6200_.28CSAR.29_coating|CSAR on Coater1 and Coater2]]
*[[Specific_Process_Knowledge/Lithography/Coaters/Spin_Coater:_Gamma_E-beam_and_UV_processing#AZ_4562_coating|AZ 4562 on Coater2]]
*[[Specific_Process_Knowledge/Lithography/Coaters/Spin_Coater:_Gamma_E-beam_and_UV_processing#Edge_bead_removal_2|Edge bead removal on Coater1 and Coater2]]
[[Image:Spinner_RCD8_C-1.jpg|400px|thumb|Spin coater: RCD8 is located in C-1]]
'''Feedback to this section''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Lithography/Coaters#Spin_Coater:_RCD8 click here]'''
Spin Coater: RCD8 is a model RCD8 T spin coater from Süss MicroTec with a motorized media arm and Gyrset functionality. It's primary purpose is spin coating of SU-8 resist. However, due to the possibility of using a non-vacuum chuck, the spin coater is also suitable for coating of substrates with e.g. textured backsides or membranes.
'''The user manual, user APV, and contact information can be found in [http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=360 LabManager]'''
===[[Specific Process Knowledge/Lithography/Coaters/Spin Coater: RCD8 processing|Process information]]===
[[Specific Process Knowledge/Lithography/Coaters/Spin Coater: RCD8 processing#Spin coating|Spin coating]]
[[Specific Process Knowledge/Lithography/Coaters/Spin Coater: RCD8 processing#Automatic dispense|Automatic dispense]]
[[Specific Process Knowledge/Lithography/Coaters/Spin Coater: RCD8 processing#Recipes|Recipes and templates]]
[[Specific Process Knowledge/Lithography/Coaters/Spin Coater: RCD8 processing#Processing_results|Processing results]]
=== Equipment performance and process related parameters ===
More information on resists (incl. spin curves) is available in the [[Specific_Process_Knowledge/Lithography/UVLithography#Resist_Overview|Resist Overview]].
'''This table is under construction''' [[Image:section under construction.jpg|70px]]
[[image:1042_spraycoater_overview.jpg|400x239px|right|thumb|Spray Coater in Cleanroom C-1]]
The spray coater at DTU Nanolab is located in Cleanroom C-1. The machine is an ExactaCoat from Sono-tek which can be fitted with one of three different nozzles depending on the nature of the spray coating tasks at hand. The three different nozzles (Impact, AccuMist and Vortex) are optimized for different applications such as spray coating of large areas (e.g. entire wafers), smaller areas (e.g. wafer pieces or other small samples) or already structured samples that cannot be coated uniformly by spin coating. All nozzles use an ultrasonic tranducer for atomizing the solution to be spray coated. It is therefore a prerequisite that all components are compatible with this process. This is the case with most substances, although process parameters may need optimization to give satisfactory results.
Practically any sample that will fit inside the spray coater can be processed. Spray patterns are easily programmed either using predefined spray patterns (1D line, 2D rectangles/circles/meanders/spirals) or custom 3D spray patterns.
The spray coating process as well as major features of the three nozzles are described into more detail in the manual which can be found via the Equipment Info page in LabManager under the Documents sections. The manual can also be found by clicking [http://labmanager.dtu.dk/d4Show.php?id=2523&mach=293 this direct link].
'''Further information about the spray coater (manual, process log, technical information etc.) can be found in LabManger''':
[http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=293 Spray coater in LabManager]'''
== Process development==
*[[/AZ4562|Spray coating using AZ4562]]
*[[/TISpray|Spray coating using TI Spray]]
==Equipment performance and process related parameters==
Edge bead removal on novolac-based resist and SU-8
Coating of
SU-8
AZ 5214E
AZ 4562
AZ MiR
AZ nLOF
Edge bead removal
Coating of E-beam resists
CSAR, ZEP, PMMA/MMA, HSQ(FOx)
Coating of UV resists
AZ5214E, AZ4562, AZMiR701, AZnLOF, SU-8
Coating of imprint resists
Coating of
SU-8
mr-DWL
other resists
OBS: this tool is in PolyFabLab
Spraying imprint resist
Spraying photoresist
Spraying of other solutions
Performance
Substrate handling
Cassette-to-cassette
Vacuum handling and detection
Vacuum spin chuck
Cassette-to-cassette
Vacuum handling and detection
Vacuum spin chuck
Cassette-to-cassette
Vacuum handling and detection
Vacuum spin chuck
Single substrate
Vacuum chuck for 4" and 6"
4" non-vacuum chuck for fragile substrates
Single substrate
Vacuum chucks for chips, 2", 4", and 6"
4" edge handling chuck
Single substrate
Vacuum chucks for chips, 4", and 6"
Can handle almost any sample size and shape
Permanent media
AZ MiR 701 (29cps) resist
AZ nLOF 2020 resist
AZ 5214E resist
PGMEA solvent for backside rinse and spinner bowl cleaning
DUV42S-6 (BARC)
KRF M230Y resist
KRF M35G resist
PGMEA solvent for edge bead removal and backside rinse
AR-P 6200.09 (CSAR) for 2", 4", and 6"
AZ5214E for 2", 4", and 6"
AZ MiR 701 (29cps) for 4", and 6"
AZ4562 for 4", and 6"
PGMEA solvent for edge bead removal, backside rinse, and spinner bowl cleaning
No permanent media
Only manual dispense
Only manual dispense
No permanent media
Manual dispense option
no manual dispense
syringe dispense (60cc) of PGMEA-based resist
no manual dispense
syringe dispense (60cc) of PGMEA and anisole-based resist
no manual dispense
syringe dispense (30cc) of PGMEA and anisole-based resist (2" only)
yes
pneumatic dispense for SU-8 resist and EBR solvent OBS: disabled 2024
Only manual dispense
Only manual dispense
Two syringe pumps
Process parameter range
Spindle speed
10 - 6000 rpm
10 - 6000 rpm
10 - 6000 rpm
10 - 5000 rpm (3000 rpm with non-vacuum chuck)
100 - 8000 rpm (3000 rpm with edge handling chuck)
100 - 8000 rpm
Gyrset
no
no
no
optional (max. speed 3000 rpm)
no
no
Substrates
Substrate size
50 mm wafers (tool change required)
100 mm wafers
150 mm wafers
200 mm wafers (tool change required)
100 mm wafers
150 mm wafers
200 mm wafers (may require tool change)
2" or 50 mm wafers
100 mm wafers
150 mm wafers
100 mm wafer
150 mm wafer
50 mm wafers
100 mm wafers
150 mm wafer
small pieces down to 5x5 mm2
100 mm wafers
150 mm wafer
small pieces down to 5x5 mm2
Any sample(s) that fit inside machine
Batch size
1 - 25
1 - 25
1 - 25
1
1
1
1
Allowed materials
Silicon
Glass
No resist or crystalbond allowed in the HMDS module
Silicon
Glass
Silicon
III-V materials
Glass
No resist or crystalbond allowed in the HMDS module
All cleanroom materials except III-V materials
Silicon
III-V materials
Glass
All PolyFabLab materials
All chemicals to be spray coated must be approved specifically for spray coating
Any non-toxic, non-particulate and non-crosslinking material is likely to be approved
Spin coating
The typical spin coating process consists of the following steps:
Priming (typically HMDS) followed by cooling to room temperature
Resist dispense (rotation: static or dynamic rotation)(arm: stationary or moving)
Optional: Acceleration to a low spin speed if dynamic dispense is used
Optional: Resist spreading at low spin speed for spreading thicker resists
Spin-off
Backside rinse (typically during spin-off)
Optional: Edge-bead removal
Softbake (contact or proximity)
Cooling to room temperature
After priming, the wafer is cooled to room temperature and then transferred to the spin coater. If static dispense is used, the wafer is not rotating during the resist dispense. In the case of dynamic dispense, the wafer rotates at low spin speed during the dispense. The dispense arm is normally stationary during dispense, but some substrates may require the arm to move slowly across the substrate area while dispensing. Moving arm dispensing is usually only done with a rotating substrate.
Using too high spin speed during dispense can cause surface wetting issues, while a too low spin speed causes the resist to flow onto the backside of the wafer. After dispense, a short spin at low spin speed may be used in order to spread the resist over the wafer surface before spin-off.
Spin-off
The spin-off cycle determines the thickness of the resist coating. For a given resist, the thickness is primarily a function of the spin-off speed and the spin-off time, both following an inverse power-law:
The acceleration to the spin-off speed also influences the thickness, but the effect is dependent on previous steps. The spin-off is usually a simple spin at one speed, but it may be comprised of several steps at different spin speeds. After spin-off, the wafer is decelerated.
The coated thickness, , as a function of the spin-off speed, , follows an inverse power-law:
The constant, , is a function of the resist viscosity and solid content, as well as the spin-off time. The exponent, , is dependent on solvent evaporation, and is typically ~½ for UV resists. This means that from the thickness achieved at spin speed , one can estimate the spin speed needed to achieve thickness using the relation:
For thick SU-8, however, is observed to be ~1 (probably due to the low solvent content and/or the formation of skin). In this case, the relation simply becomes:
Backside rinse
If the spin speed is too low during resist dispense, resist may creep over the edge of the wafer and onto the backside. Some resist tend to leave fine strings of resist protruding from the edge of the wafer, or folded onto the backside, an effect sometimes referred to as "cotton candy".
Any resist on the edge and backside of the wafer will contaminate the end effector, softbake hotplate, and subsequent wafers.
In a backside rinse step, solvent administered through a nozzle to the backside of the wafer, while spinning at low or medium spin speed, dissolves the resist and washes it away. After the rinse, a short spin at medium spin speed dries the wafer before the softbake.
During the backside rinse solvent inevitably creeps onto the front side of the wafer. This effect may be used to dissolve and subsequently remove an edge-bead, but it may also leave the rim of the wafer exposed. As an alternative to backside rinse, a wafer, which is contaminated on the backside, may be softbaked in proximity, in order to protect the hotplate from contamination. This leaves front side coating intact, but also leaves the backside dirty.
Edge bead
During spin coating, resist builds up at the edge of the wafer due to the change in surface tension at the edge, as well as extra drying from turbulence created by the wafer edge.
This phenomenon is called edge-bead. Dependent on spin coating parameters, the coating may be several times thicker at the edge than in the central area. In a subsequent hard contact exposure step (mask aligner), this edge-bead introduces an undesired proximity gap, which reduces the lateral resolution, and may even cause the wafer to stick to the mask.
In an edge-bead removal step, solvent administered through a nozzle positioned at the edge of the wafer, while spinning at low or medium spin speed, dissolves the resist and washes it away. After the removal, a short spin at medium spin speed dries the wafer before the softbake. Dependent on the viscosity (solvent content) of the resist after the edge-bead removal, this drying spin may cause the resist to re-flow and create a secondary edge-bead. In some cases, it may be necessary to (partially) softbake the resist before edge-bead removal.
Softbake
After spin coating, the solvent in the resist must be evaporated in a baking step, in order to solidify the resist. This softbake can be carried out as a contact bake or a proximity bake. In a contact bake, the wafer is held in close contact to the hotplate surface, either in direct contact on the manual hotlpates or by resting on shallow bumps 150 µm above the hotplate in the Gamma tools. In a proximity bake, the wafer is first moved into proximity, e.g. 1mm, of the hotplate surface, then held there (on the lift pins) for the duration of the bake.
Spin coaters at DTU Nanolab
Spin Coater: Gamma UV
Spin Coater: Gamma UV in E-5
Spin Coater: Gamma UV was installed at DTU Nanolab in March 2015. It is a Gamma 2M cluster from Süss MicroTec with spin coating, HMDS vapour priming, and baking modules.
The system handles 4" and 6" wafers without size conversion, and can be set up to handle 2" or 8".
The coater is equipped with 3 different resist lines, as well as 1 syringe line:
AZ MiR 701
AZ nLOF 2020
AZ 5214E
Syringe, which can be used for various resists
The processes that are available on the system are developed by Nanolab. Upon request, it is possible to establish new processes. Use of the syringe requires special training, and would as a starting point require batches in excess of 20 wafers.
Equipment performance and process related parameters
Purpose
HMDS priming
Spin coating of PGMEA based UV resists
Spin coating of E-beam resists 1)
Soft baking
Resist
AZ MiR 701 (29cps)
AZ nLOF 2020
AZ 5214E
60cc syringe dispense
Performance
HMDS contact angle
60 - 80°
Coating thickness
AZ MiR 701: 1.5-4 µm
AZ nLOF 2020: 1.5-5 µm
AZ 5214E: 1.5-5 µm
AZ 4562: 5-15 µm
Process parameters
Priming temperature
120 °C
Spin speed
10 - 6000 rpm
Spin acceleration
10 - 10000 rpm/s
Hotplate temperature
25 - 200 °C
Cool plate temperature
21 °C
Substrates
Substrate size
50 mm wafers 1)
100 mm wafers
150 mm wafers
200 mm wafers 1)
Allowed materials
Silicon and glass
Resists and crystalbond are not allowed in the HMDS module
Batch
1 - 25
1) Requires tool change.
Spin coater: Süss stepper
The SÜSS Spinner-Stepper is placed in F-3
This spinner is dedicated for spinning DUV resists. The spinner is fully automatic and can run up to 25 substrates in a batch 4", 6", and 8" size (8" requires tool change). The machine is equipped with the 3 resist lines (DUV42S-6, KRF M230Y, and KRF M35G), as well as a syringe dispense system.
The user manual, quality control procedures and results, user APVs, and contact information can be found in LabManager:
The spinning process will be performed by the customer together with the Photolith group of Nanolab. In case you would like to do DUV lithography, please contact Lithography team, who will consult you and run your wafers together with you.
Equipment performance and process related parameters
Purpose
Spin coating and soft baking of BARC
Spin coating and soft baking of DUV resists
Post exposure baking
Resist
BARC DUV42S-6
Positive tone resist KRF M230Y
Positive tone resist KRF M35G
Negative tone resist UVN2300-0.8
Performance
Coating thickness
BARC DUV42S-6 60-90nm
Positive tone resist KRF M230Y 300-600nm
Positive tone resist KRF M35G 800-1600nm
Negative tone resist UVN2300-0.8 200-1400nm
Process parameters
Spin speed
10 - 5000 rpm
Spin acceleration
100 - 10000 rpm/s
Hotplate temperature
175°C for BARC baking
130°C for positive tone resist soft baking and post exposure baking
100°C for negative tone resist soft baking and post exposure baking
Substrates
Substrate size
100 mm wafers
150 mm wafers
200 mm wafers (requires tool change)
Allowed materials
Any standard cleanroom material
Batch
1 - 25
Spin Coater: Gamma E-beam and UV
Spin Coater: Gamma E-beam & UV in E-5
Spin Coater: Gamma E-beam and UV was installed at DTU Nanolab in June 2017. It is a Gamma 4M cluster from Süss MicroTec with spin coating, HMDS vapour priming, and baking modules. The system handles 2", 4", and 6" wafers without size conversion, using two separate coater stations.
The 2" coater station is equipped with 1 resist line, as well as 1 syringe line:
AR-P 6200.09 (CSAR)
Syringe, which can be used for various resists (anisole-based or PGMEA-based). We currently recommend against using the syringe, as the process setup is quite demanding. Use a manual spin coater instead.
The 4"/6" coater station is equipped with 4 different resists lines:
AZ 5214E
AZ MiR 701
AR-P 6200.09 (CSAR)
AZ 4562
The processes that are available on the system are developed by Nanolab. Upon request, it is possible to establish new processes. Use of the syringe requires special training, and requires batch processing - it is not for processing a few wafers now and then.
Equipment performance and process related parameters
Purpose
HMDS priming
Spin coating of anisole based E-beam resists
Spin coating of PGMEA based UV resists
Soft baking
Edge bead removal (CSAR and novolac-based UV resists)
Resist
AR-P 6200.09 (CSAR)
AZ 5214E
AZ MiR 701 (29cps)
AZ 4562
30cc syringe dispense
Performance
HMDS contact angle
60 - 80° (on Silicon)
Coating thickness
AR-P 6200.09 (CSAR): 170-500 nm
AZ 5214E: 1.5-5 µm
AZ MiR 701: 1.5-4 µm
AZ 4562: 5-25 µm
Process parameters
Priming temperature
120 °C
Spin speed
10 - 6000 rpm
Spin acceleration
10 - 10000 rpm/s
Hotplate temperature
25 - 200 °C
Cool plate temperature
21 °C
Substrates
Substrate size
50 mm wafers
100 mm wafers
150 mm wafers
Allowed materials
Silicon, III-V, and glass
Resists and crystalbond are not allowed in the HMDS module
Batch
1 - 25
Spin Coater: RCD8
Spin coater: RCD8 is located in E-4
Spin Coater: RCD8 is a model RCD8 T spin coater from Süss MicroTec with a motorized media arm and Gyrset functionality. It's primary purpose is spin coating of SU-8 resist. The media arm was disabled in 2024.
However, due to the possibility of using a non-vacuum chuck, the spin coater is also suitable for coating of substrates with e.g. textured backsides or membranes.
The user manual, user APV, and contact information can be found in LabManager - requires login
SU-8 3000 series
SU-8 series
mr-DWL
LOR (1A, 3A, 5A)
mr-i 8030e
mr-NIL200
DELO-PRE/OM4310
OrmoStamp
Inkron
mr-I 8020E
OM4310
AR-P 617/AR-N 7520 New
PGME/PGMEA
Acetone
AR-N 7500 series
Polymer Ps-b-PDMS/block copolymer
Heptane
Ethyl Acetate
DIRTY bowlset
Anything Organic
Use the appropriate cleaning reagent for your resist
Equipment performance and process related parameters
Purpose
Labspin
Spin coating of resist ONLY in dedicated bowlsets
Please do NOT use substances which is not for the dedicated bowlsets
Dirty bowlset
Spin coating of other substances in dirty bowlset
Process parameters
Spin speed
Vacuum chuck: 100 - 8000 rpm
Edge handling chuck: Max. 3000 rpm
Spin acceleration
200 - 4000 rpm/s
Substrates
Substrate size
Chips 5x5 mm and up
50 mm wafers
100 mm wafers
150 mm wafers
Allowed materials
All cleanroom materials
Please ONLY use substances which is for the dedicated bowlsets in labspins
Batch
1
Spin Coater: LabSpin 04
Spin coater: LabSpin 04 is located in PolyFabLab in building 347
Spin Coater: LabSpin 04 is a model LabSpin6 TT spin coater from SUSS. It's primary purpose is spin coating of SU-8 resist. It was installed in PolyFabLab in 2025.
The user manual, user APV, and contact information can be found in LabManager - requires login
Training video (same tool in Cleanroom 346): LabSpin02 + 03
Process information
Useful information about resist dispense can be found here.
Equipment performance and process related parameters
Purpose
Spin coating of epoxy based resists
SU-8 series
SU-8 3000 series
SU-8 XFT series
mr-DWL series
Spin coating of other resists
Resist
manual dispense
Performance
Coating thickness
SU-8 resists: 0.1-200 µm
Coating thickness range is dependent on specific resist formulation
Process parameters
Spin speed
100 - 8000 rpm
Spin acceleration
200 - 4000 rpm/s (wrongly labelled 1/s^2 in the software)
Substrates
Substrate size
chips, 5mm and up
100 mm wafers
150 mm wafers
Allowed materials
All PolyFabLab materials
See Cross Contamination Sheet in LabManager
Batch
1
Spray Coater
Spray Coater in Cleanroom C-1
The spray coater at DTU Nanolab is located in Cleanroom C-1. The machine is an ExactaCoat from Sono-tek which can be fitted with one of three different nozzles depending on the nature of the spray coating tasks at hand. The three different nozzles (Impact, AccuMist and Vortex) are optimized for different applications such as spray coating of large areas (e.g. entire wafers), smaller areas (e.g. wafer pieces or other small samples) or already structured samples that cannot be coated uniformly by spin coating. All nozzles use an ultrasonic tranducer for atomizing the solution to be spray coated. It is therefore a prerequisite that all components are compatible with this process. This is the case with most substances, although process parameters may need optimization to give satisfactory results.
Practically any sample that will fit inside the spray coater can be processed. Spray patterns are easily programmed either using predefined spray patterns (1D line, 2D rectangles/circles/meanders/spirals) or custom 3D spray patterns.
The spray coating process as well as major features of the three nozzles are described into more detail in the manual which can be found via the Equipment Info page in LabManager under the Documents sections. The manual can also be found in Labmanager - requires login
Further information about the spray coater (manual, process log, technical information etc.) can be found in LabManger:
Spray coating using TI spray:
The TI spray resist is the standard spray coater resist used at DTU Nanolab. It requires no dilution and performs well.
Spray coating using other resists:
Other resists are allowed, but most require dilution, as the spray coater will not work with any resist viscosity higher than 20 cP.
Equipment performance and process related parameters
Equipment
Spray Coater
Purpose
Spraying imprint resists (primarily mr-NIL 6000E and mr-I 8000E)
Spraying photoresist (primarily AZ-4562)
Spraying of other solutions
Performance
Substrate handling
Can handle almost any sample size and shape (although no automatic handling)
Permanent media
No permanent media
Manual dispense option
Two syringe pumps
Process parameter range
Solution viscosity
Should not exceed 20 cP
Chemical properties
Must be non-toxic
Must be compatible with titanium
Resistant to ultrasonic sonication
Substrates
Batch size
Any sample(s) size and number that fit inside machine
Allowed materials
All chemicals to be spray coated must be approved specifically for spray coating
Most non-toxic, non-particulate and non-crosslinking material likely to be approved
Suspensions challenging due to very low diameter tubing