Specific Process Knowledge/Thin film deposition/Deposition of Tantalum: Difference between revisions

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== Tantalum deposition ==
== Tantalum deposition ==
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|0.5Å/s to 10Å/s
|0.5Å/s to 10Å/s
|~0.3Å/s
|~0.3Å/s
|Not been tested
|at least in the range 1 Å/s to 4 Å/s
|-
|-
|-style="background:WhiteSmoke; color:black"  
|-style="background:WhiteSmoke; color:black"  
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! Comment
! Comment
| Tantalum deposition heats the chamber*
| Tantalum deposition heats the chamber*
|
| 2-inch Ta target
| 3-inch Ta target
| 3-inch Ta target
|}
|}


'''*'''  ''The max thickness is limited to 200 nm as Ta deposition heats the chamber. If you wish to deposit more than that, it has to be done in several steps. The temperature on the back of a Si wafer rose to above 160 °C during deposition of 40 nm Ta even when using a cooling plate. If you wish to e-beam deposit Ta, please contact the [mailto:thinfilm@nanolab.dtu.dk Thin film group].''
'''*'''  ''The max thickness is limited to 200 nm as Ta deposition heats the chamber. If you wish to deposit more than that, it has to be done in several steps. The temperature on the back of a Si wafer rose to above 160 °C during deposition of 40 nm Ta even when using a cooling plate. If you wish to e-beam deposit Ta, please contact the [mailto:thinfilm@nanolab.dtu.dk Thin film group].''

Latest revision as of 12:13, 13 June 2023

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Tantalum deposition

Tantalum can be deposited by e-beam evaporation and sputter deposition. In the chart below you can compare the different deposition equipment.

Sputtering of Tantalum

You can read more about Ta sputter deposition using Sputter-System(Lesker)

E-beam evaporation of Tantalum

Tantalum can be deposited by e-beam assisted evaporation in the Temescal tool.


E-beam evaporation (Temescal) Sputter (Lesker) Sputter deposition (Sputter-system Metal-Oxide (PC1) and Sputter-system Metal-Nitride (PC3))
General description E-beam deposition of Ta

(line-of-sight deposition)

Sputter deposition of Ta

(not line-of-sight)

Sputter deposition of Ta

(not line-of-sight)

Pre-clean Ar ion source RF Ar clean RF Ar clean
Layer thickness 10Å to 0.2 µm* 10Å to ? 10Å to ?
Deposition rate 0.5Å/s to 10Å/s ~0.3Å/s at least in the range 1 Å/s to 4 Å/s
Batch size
  • Up to 4x6" wafers
  • Up to 3x8" wafers (ask for holder)
  • Many smaller pieces
  • Pieces or
  • 1x4" wafer or
  • 1x6" wafer
  • Pieces or
  • 10x4" wafer or
  • 10x6" wafer
Allowed materials
  • Silicon
  • Silicon oxide
  • Silicon nitride
  • Silicon (oxy)nitride
  • Photoresist
  • PMMA
  • Mylar
  • SU-8
  • Metals
  • Carbon
  • Silicon
  • Silicon oxide
  • Silicon nitride
  • Silicon (oxy)nitride
  • Photoresist
  • PMMA
  • Mylar
  • SU-8
  • Metals
  • Carbon
Comment Tantalum deposition heats the chamber* 2-inch Ta target 3-inch Ta target

* The max thickness is limited to 200 nm as Ta deposition heats the chamber. If you wish to deposit more than that, it has to be done in several steps. The temperature on the back of a Si wafer rose to above 160 °C during deposition of 40 nm Ta even when using a cooling plate. If you wish to e-beam deposit Ta, please contact the Thin film group.