LabAdviser/314/Microscopy 314-307/TEM/ATEM: Difference between revisions
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[[Category:314]] | [[Category:314]] | ||
[[Category:314-Microscopy]] | [[Category:314-Microscopy]] | ||
''This section is written by DTU Nanolab internal if nothing else is stated.'' | |||
[[File:Warning Computer Machine.png|left|100x100px]] | |||
== The Titan ATEM is not available at DTU Nanolab any longer. The information here is just for reference. == | |||
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[[image:8212.JPG|400x400px|right|thumb|Titan ATEM in building 314.]] | [[image:8212.JPG|400x400px|right|thumb|Titan ATEM in building 314.]] | ||
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= FEI Titan 80-300 ATEM = | = FEI Titan 80-300 ATEM = | ||
Titan Analytical can be used in two conditions, transmission (TEM) and scanning transmission (STEM) modes. It is equipped with the FEI X-FEG gun and monochromator, which allows experiments at 120 kV or 300 kV acceleration voltage. With the momochromator, the energy spread can be adjusted between about 1 eV and below 0.2 eV. Furthermore, a CEOS CESCOR Cs-corrector of the condenser lens system is installed. The objective lens has the super-twin (S-Twin) pole piece with 5. | Titan Analytical can be used in two conditions, transmission (TEM) and scanning transmission (STEM) modes. It is equipped with the FEI X-FEG gun and monochromator, which allows experiments at 120 kV or 300 kV acceleration voltage. With the momochromator, the energy spread can be adjusted between about 1 eV and below 0.2 eV. Furthermore, a CEOS CESCOR Cs-corrector of the condenser lens system is installed. The objective lens has the super-twin (S-Twin) pole piece with 5.4 mm pole gap (Cs about 1.2 mm). The point (interpretable) resolutions for TEM and STEM at 300 kV are 0.2 and 0.08 nm, respectively, which allows atomic arrangements in materials to be visualized clearly. For TEM, a Gatan Ultrascan US1000 CCD (2048x2048 px) is installed, for STEM, a high-angle annular dark field detector (HAADF) or BF/DF detector of the GIF system can be used.<br /> | ||
For energy dispersive X-ray spectroscopy (EDS) an Oxford windowless X-Max 100TLE detector is installed, which is running Oxford Aztec analysis software. For electron energy loss spectroscopy (EELS) and energy filtered imaging (EF-TEM), the microscope is equipped with a Gatan Tridiem 865 GIF and a Gatan Ultrascan US1000 CCD (2048x2048 px). The microscope can be used for elemental analysis from regions that are as small as 1 nm and is specifically suited for EDS and EELS mapping (Gatan Digiscan). Specially, monochromated EELS, which is reachable to an energy resolution of 0.15 eV, allows the distribution of surface plasmons in nanostructured materials to be imaged at the nanometer scale and makes possible to determine the valence state of elements (e.g., Fe2+/Fe3+ ratios).<br /> | For energy dispersive X-ray spectroscopy (EDS) an Oxford windowless X-Max 100TLE detector is installed, which is running Oxford Aztec analysis software. For electron energy loss spectroscopy (EELS) and energy filtered imaging (EF-TEM), the microscope is equipped with a Gatan Tridiem 865 GIF and a Gatan Ultrascan US1000 CCD (2048x2048 px). The microscope can be used for elemental analysis from regions that are as small as 1 nm and is specifically suited for EDS and EELS mapping (Gatan Digiscan). Specially, monochromated EELS, which is reachable to an energy resolution of 0.15 eV, allows the distribution of surface plasmons in nanostructured materials to be imaged at the nanometer scale and makes possible to determine the valence state of elements (e.g., Fe2+/Fe3+ ratios).<br /> | ||
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= Calibration = | = Calibration = | ||
*[[Media:ATEM collection-angles.xlsx|GIF collection angles (20220209)]] | |||
*Magnification calibration cameras | *Magnification calibration cameras | ||
*Convergence angles STEM | *Convergence angles STEM | ||
= Process information = | = Process information = | ||