LabAdviser/314/Microscopy 314-307/Technique/EELS: Difference between revisions
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'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/Microscopy_314-307/Technique/EELS click here]''' | '''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/Microscopy_314-307/Technique/EELS click here]''' | ||
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The fast electron beam can lose energy by exciting electrons in the outer or inner atomic shells of atoms to higher unoccupied energy states. Outer-shell single electron excitations can be seen as peaks at energies up to ~ 50 eV in the energy-loss spectrum. At higher energies the scattering intensity decreases according to a high power of the energy-loss and inner-shell electron excitations are seen as edges superimposed on this smoothly decreasing background (marked as ionisation edge in Fig. 1). In addition, the energy-loss spectrum can contain peaks corresponding to plasmon excitations. Plasmons can be excited within the specimen, i.e. a bulk plasmon, or at an interface, i.e. an interface plasmon. Plasmons generally occur in the range 5 – 30 eV, at energies higher than the band gap of the material. The first 50 eV of an energy-loss spectrum is usually referred to as the low-loss region. Higher energy-loss regions containing inner-shell ionisation edges are usually referred to as the core-loss region. | The fast electron beam can lose energy by exciting electrons in the outer or inner atomic shells of atoms to higher unoccupied energy states. Outer-shell single electron excitations can be seen as peaks at energies up to ~ 50 eV in the energy-loss spectrum. At higher energies the scattering intensity decreases according to a high power of the energy-loss and inner-shell electron excitations are seen as edges superimposed on this smoothly decreasing background (marked as ionisation edge in Fig. 1). In addition, the energy-loss spectrum can contain peaks corresponding to plasmon excitations. Plasmons can be excited within the specimen, i.e. a bulk plasmon, or at an interface, i.e. an interface plasmon. Plasmons generally occur in the range 5 – 30 eV, at energies higher than the band gap of the material. The first 50 eV of an energy-loss spectrum is usually referred to as the low-loss region. Higher energy-loss regions containing inner-shell ionisation edges are usually referred to as the core-loss region. | ||
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== more detailed information == | |||
*[[LabAdviser/314/Microscopy 314-307/Technique/X-ray_spectroscopy/EDS-SEM|EDS-SEM with Oxford Aztec]] | |||
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== relevant microscopes == | |||
*[[LabAdviser/314/Microscopy_314-307/TEM/T20|Tecani T20]] | |||
*[[LabAdviser/314/Microscopy_314-307/TEM/ATEM|Titan ATEM]] | |||
*[[LabAdviser/314/Microscopy_314-307/TEM/ETEM|Titan ETEM]] | |||
== literature == | |||
1. Carter, C. Barry, and David B. Williams. “Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry.” Springer International Publishing, 2016, doi:10.1007/978-3-319-26651-0. | |||
2. Egerton, R. F. “Electron Energy-Loss Spectroscopy in the Electron Microscope.” Electron Energy-Loss Spectroscopy in the Electron Microscope, Springer Science+Business Media, LLC, 2011. | |||