Specific Process Knowledge/Characterization/XPS/Nexsa: Difference between revisions
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The XPS Nexsa offers a variety of surface analysis techniques in addition to its main XPS technique. | The XPS Nexsa offers a variety of surface analysis techniques in addition to its main XPS technique. | ||
[[Image: | [[Image:XPS Nexsa instrument.jpg |frame|300px|The XPS Nexsa.]] | ||
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== Process information == | == Process information == | ||
'''The XPS Nexsa with '''<span title="The only analytical option (as opposed to hardware options such as chillers, factory training courses, uninterruptible power supplies etc.) not chosen is a vacuum transfer module " >''' ''all'' '''</span>''' but one options''' | |||
XPS is a well established technique at DTU Nanolab; we know what we can get from it and so do the users. Take a look at the page of the [[Specific Process Knowledge/Characterization/XPS/K-Alpha|XPS K-Alpha]] to find more information. The situation is slightly different with the other analytical techniques that the Nexsa offers. These options were not added because we have an urgent need for them in some project - rather, we chose to add them because we got an irresistible offer. Also, should any need for them arise in the future, the price of adding them once the instrument left the factory would be a lot higher. As a result, we don't have any applications waiting to explore what they can offer. | |||
'''Check out the alternative techniques!''' | |||
It is clearly in everybody's interest that the techniques are explored - that we throw all kinds of samples at them and that we investigate what kind of knowledge we can extract. Ideally, all this knowledge that we acquire should be shared among all the users. We therefore strongly urge you to take a look at the techniques on the pages listed below. Here, we will collect technical information and publications so that, hopefully, you will get inspired to explore the techniques with all kinds of samples. | |||
*[https://xpssimplified.com/whatisxps.php XPSsimplified - The Thermofisher web page on all the Nexsa techniques] | |||
*[[Specific Process Knowledge/Characterization/XPS/XPS technique|The XPS technique]] | *[[Specific Process Knowledge/Characterization/XPS/XPS technique|The XPS technique]] | ||
*[[Specific Process Knowledge/Characterization/XPS/ISS|Ion Scattering Spectroscopy or ISS]] | *[[Specific Process Knowledge/Characterization/XPS/ISS|Ion Scattering Spectroscopy or ISS]] | ||
*[[Specific Process Knowledge/Characterization/XPS/REELS|Reflected Electron Energy Loss Spectroscopy or REELS]] | *[[Specific Process Knowledge/Characterization/XPS/REELS|Reflected Electron Energy Loss Spectroscopy or REELS]] | ||
*[[Specific Process Knowledge/Characterization/XPS/Raman|Raman spectroscopy]] | *[[Specific Process Knowledge/Characterization/XPS/Raman|Raman spectroscopy]] | ||
*[[Specific Process Knowledge/Characterization/XPS/UPS technique|Ultraviolet Photoelectron Spectroscopy or UPS | *[[Specific Process Knowledge/Characterization/XPS/UPS technique|Ultraviolet Photoelectron Spectroscopy or UPS]] | ||
*[[Specific Process Knowledge/Characterization/XPS/NexsaOverview|Table with a set of publications in which multiple techniques are used]] | |||
'''Specific measurements''' | |||
The Nexsa will allow you to characterize the sample in many ways. The list of parameters that can be determined are: | |||
; Work function | |||
: Based on the measurements of the Fermi Level and the spectrum energy cut-off in a UPS spectrum, the work function may be measured. The Nexsa manual section 3.6.x has more information. | |||
; Band gap measurements | |||
: Based on the REELS spectra the band gap may be determined. | |||
; Electronic band structure | |||
: Using Angle resolved XPS (ARXPS) and UPS (ARUPS) the electronic band structure may be mapped. | |||
== Getting access to the XPS == | == Getting access to the XPS == | ||
Click [[Specific Process Knowledge/Characterization/XPS/Access | '''HERE''' ]] to see information on how to get access to the XPS. | Click [[Specific Process Knowledge/Characterization/XPS/Access | '''HERE''' ]] to see information on how to get access to the XPS. | ||
== Thermofisher sales documents == | == Thermofisher sales documents == | ||
*[https://assets.thermofisher.com/TFS-Assets/MSD/brochures/BR52913-EN-Nexsa-XPS-Brochure.pdf Nexsa Surface Analysis System] | *[https://assets.thermofisher.com/TFS-Assets/MSD/brochures/BR52913-EN-Nexsa-XPS-Brochure.pdf Nexsa Surface Analysis System] | ||
Latest revision as of 07:33, 28 April 2023
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The XPS Nexsa
Name: XPS Nexsa
Vendor: Thermofisher Scientific
The XPS Nexsa offers a variety of surface analysis techniques in addition to its main XPS technique.
The user manual(s), user APV(s), technical information and contact information are be found in LabManager:
Process information
The XPS Nexsa with all but one options
XPS is a well established technique at DTU Nanolab; we know what we can get from it and so do the users. Take a look at the page of the XPS K-Alpha to find more information. The situation is slightly different with the other analytical techniques that the Nexsa offers. These options were not added because we have an urgent need for them in some project - rather, we chose to add them because we got an irresistible offer. Also, should any need for them arise in the future, the price of adding them once the instrument left the factory would be a lot higher. As a result, we don't have any applications waiting to explore what they can offer.
Check out the alternative techniques!
It is clearly in everybody's interest that the techniques are explored - that we throw all kinds of samples at them and that we investigate what kind of knowledge we can extract. Ideally, all this knowledge that we acquire should be shared among all the users. We therefore strongly urge you to take a look at the techniques on the pages listed below. Here, we will collect technical information and publications so that, hopefully, you will get inspired to explore the techniques with all kinds of samples.
- XPSsimplified - The Thermofisher web page on all the Nexsa techniques
- The XPS technique
- Ion Scattering Spectroscopy or ISS
- Reflected Electron Energy Loss Spectroscopy or REELS
- Raman spectroscopy
- Ultraviolet Photoelectron Spectroscopy or UPS
- Table with a set of publications in which multiple techniques are used
Specific measurements
The Nexsa will allow you to characterize the sample in many ways. The list of parameters that can be determined are:
- Work function
- Based on the measurements of the Fermi Level and the spectrum energy cut-off in a UPS spectrum, the work function may be measured. The Nexsa manual section 3.6.x has more information.
- Band gap measurements
- Based on the REELS spectra the band gap may be determined.
- Electronic band structure
- Using Angle resolved XPS (ARXPS) and UPS (ARUPS) the electronic band structure may be mapped.
Getting access to the XPS
Click HERE to see information on how to get access to the XPS.