Template:SEM comparison table 314: Difference between revisions
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! Equipment | ! Equipment | ||
<!-- ![[Specific Process Knowledge/Characterization/SEM Inspect S|SEM Inspect S]] --> | <!-- ![[Specific Process Knowledge/Characterization/SEM Inspect S|SEM Inspect S]] --> | ||
![[LabAdviser/314/SEM/Nova|Nova]] | ![[LabAdviser/314/Microscopy 314-307/SEM/Nova|Nova]] | ||
![[LabAdviser/314/SEM/QFEG|QFEG]] | ![[LabAdviser/314/Microscopy 314-307/SEM/QFEG|QFEG]] | ||
![[LabAdviser/314/SEM/AFEG|AFEG]] | ![[LabAdviser/314/Microscopy 314-307/SEM/AFEG|AFEG]] | ||
![[LabAdviser/314/FIB/Helios|Helios]] | ![[LabAdviser/314/Microscopy 314-307/FIB/Helios|Helios]] | ||
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* Z 50mm | * Z 50mm | ||
* R 360⁰ | * R 360⁰ | ||
* T 70⁰ | * T 70⁰ Manual | ||
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* X 150mm Piezo | * X 150mm Piezo | ||