Specific Process Knowledge/Thermal Process/A3 Phosphor Drive-in furnace: Difference between revisions
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''This page is written by DTU Nanolab internal'' | |||
[[Category: Equipment |Thermal A3]] | [[Category: Equipment |Thermal A3]] | ||
[[Category: Thermal process|Furnace]] | [[Category: Thermal process|Furnace]] | ||
[[Category: Furnaces|A3]] | [[Category: Furnaces|A3]] | ||
==Phosphorus Drive-in furnace (A3)== | ==Phosphorus Drive-in furnace (A3)== | ||
[[Image:A3helstak.jpg|thumb|400x400px|Phosphorus Drive-in furnace (A3). Positioned in cleanroom B-1]] | [[Image:A3helstak.jpg|thumb|400x400px|Phosphorus Drive-in furnace (A3). Positioned in cleanroom B-1/ Photo: DTU Nanolab internal]] | ||
The Phosphorus Drive-in furnace (A3) is a Tempress horizontal furnace for thermal oxidation of silicon wafers. Furthermore, the furnace is used for phosphorus drive-in afte pre-deposition/doping or after boron ion implantation. | The Phosphorus Drive-in furnace (A3) is a Tempress horizontal furnace for thermal oxidation of silicon wafers. Furthermore, the furnace is used for phosphorus drive-in afte pre-deposition/doping or after boron ion implantation. | ||
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==Process knowledge== | ==Process knowledge== | ||
*Oxidation: look at the [[Specific Process Knowledge/Thermal Process/Oxidation|Oxidation]] page | *Oxidation: look at the [[Specific Process Knowledge/Thermal Process/Oxidation|Oxidation]] page | ||
* | *Phosphorus drive-in: look at the [[Specific Process Knowledge/Thermal Process/Dope with Phosphorus|Dope with Phosphorus]] page | ||
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*[http:// | *[http://labmanager.dtu.dk/d4Show.php?id=2847&mach=82 The QC procedure for Phosphorus drive-in furnace (A3)]<br> | ||
*[ | *[https://labmanager.dtu.dk/view_binary.php?type=data&mach=82 The newest QC data for wet and dry oxide]<br> | ||
{| {{table}} | {| {{table}} | ||
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! QC Recipe: | ! QC Recipe: | ||
! | ! WET1050 | ||
! | ! DRY1050 | ||
|- | |- | ||
| H<sub>2</sub> flow | | H<sub>2</sub> flow | ||
| Line 53: | Line 53: | ||
|- | |- | ||
|Temperature | |Temperature | ||
|1050 C | |1050 <sup>o</sup>C | ||
|1050 C | |1050 <sup>o</sup>C | ||
|- | |- | ||
|Oxidation time | |Oxidation time | ||
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and over the boat) | and over the boat) | ||
|- | |- | ||
! | !DRY1050 | ||
|110-116 nm | |110-116 nm | ||
|3 % | |3 % | ||
|- | |- | ||
! | !WET1050 | ||
|305-321 nm | |305-321 nm | ||
|5 % | |5 % | ||
| Line 80: | Line 80: | ||
|- | |- | ||
|} | |} | ||
Numbers from March 2020 | |||
|} | |} | ||
==Overview of the performance of the phosphorus drive-in furnace and some process related parameters== | ==Overview of the performance of the phosphorus drive-in furnace and some process related parameters== | ||
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!style="background:silver; color:black;" align="center"|Purpose | !style="background:silver; color:black;" align="center"|Purpose | ||
|style="background:LightGrey; color:black"| | |style="background:LightGrey; color:black"| | ||
* | *Thermal oxidation of Si wafers | ||
* | *Driving-in pre-deposited or ion-implanted phosphorus | ||
|style="background:WhiteSmoke; color:black"| | |||
|style="background:WhiteSmoke; color:black"| | Thermal oxidation: | ||
*Dry | *Dry oxidation using O<sub>2</sub> | ||
*Wet oxidation using H<sub>2</sub>O vapour | |||
Driving-in pre-deposited or ion-implanted phosphorus | |||
*Dry or wet oxidation recipes are normally used for this purpose | |||
|- | |- | ||
!style="background:silver; color:black" align="center"|Performance | !style="background:silver; color:black" align="center"|Performance | ||
|style="background:LightGrey; color:black"|Film thickness | |style="background:LightGrey; color:black"|Film thickness and quality | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*Dry | *Dry oxide: ~ 0 nm - 300 nm (it takes too long to grow a thicker oxide) | ||
*Wet | *Wet oxide: ~ 0 nm - 3 µm (23 hours wet oxidation at 1100 <sup>o</sup>C for Si[100] wafers) | ||
* [[Specific Process Knowledge/Thermal Process/Oxidation/Breakdown voltage measurements/A3 furnace break-down voltage measurement results|Break-down voltage measurement results]] | |||
|- | |- | ||
!style="background:silver; color:black" align="center" valign="center" rowspan="3"|Process parameter range | !style="background:silver; color:black" align="center" valign="center" rowspan="3"|Process parameter range | ||
|style="background:LightGrey; color:black"|Process Temperature | |style="background:LightGrey; color:black"|Process Temperature | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*800-1150 <sup>o</sup>C | *800 <sup>o</sup>C - 1150 <sup>o</sup>C | ||
|- | |- | ||
|style="background:LightGrey; color:black"|Process pressure | |style="background:LightGrey; color:black"|Process pressure | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*1 atm | *1 atm (no vacuum) | ||
|- | |- | ||
|style="background:LightGrey; color:black"|Gasses on the system | |style="background:LightGrey; color:black"|Gasses on the system | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*O<sub>2</sub>, | *N<sub>2</sub> | ||
*O<sub>2</sub> | |||
*H<sub>2</sub> (in a torch, H<sub>2</sub> and O<sub>2</sub> burns into H<sub>2</sub>O for wet oxidation) | |||
|- | |- | ||
!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Substrates | !style="background:silver; color:black" align="center" valign="center" rowspan="2"|Substrates | ||
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|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*Silicon wafers (RCA cleaned) | *Silicon wafers (RCA cleaned) | ||
*Wafers from | *Wafers coming from the Phosphorus Pre-dep furnace that have been BHF etched in the dedicated bath in the RCA bench can go directly into the furnace | ||
|- | |- | ||
|} | |} | ||