LabAdviser/314/Microscopy 314-307/TEM/T20: Difference between revisions
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[[Category:314]] | |||
[[Category:314-Microscopy]] | |||
[[File:IMG_2076.JPG|400x400px|right|thumb|Tecnai T20 in building 314.]] | |||
= FEI Tecnai T20 = | |||
DTU Nanolabs Tecnai T20 is a transmission electron microscope (TEM) used for performing both conventional imaging and diffraction, high resolution and scanning transmission microscopy (STEM) measurements. It is a versatile instrument, ideal for studying a wide range of general and advanced materials, soft matter, composites, etc. The microscope is equipped to carry out chemical analysis as well as Cryo-TEM for soft materials.<br /> | |||
The Tecnai T20 is a transmission electron microscope equipped with a thermionic electron source with a Lab6 filament and acceleration voltages that can vary between 80-200 kV. It has the FEI super-twin (S-Twin) pole piece with a pole piece gap of 5.2 mm (Cs about 1.35 mm). This gives the microscope a resolution @ 200 kV of 1.4 Å in TEM mode. Other tecniques available on the microscope are scanning transmission electron microscopy (STEM, resolution 10 Å) with a high-angle annular dark-field detector (HAADF). Additionally, it is equipped with retractable cryo plates, which makes it ideal for cryo experiments.<br /> | |||
= TEM Schematic = | On the analytical side, the microscope is equipped with an Oxford X-Max 80T SDD X-ray detector for Energy Dispersive X-ray (EDS) spectroscopy and a Gatan Tridiem 863 imaging filter allowing for electron energy-loss spectroscopy (EELS) and energy-filtered imaging (EF-TEM). For imaging, the microscope is equipped with TVIPS XF416 CMOS (4096x4096 px) before the the energy filter and a GATAN Ultrascan US1000 (2048x2048 px) after the energy filter.<br /> | ||
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== TEM Schematic == | |||
A general schematic of a transmission electron microscope can be found [[/Schematic|here]] | A general schematic of a transmission electron microscope can be found [[/Schematic|here]] | ||
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= Sample holders = | == Sample holders == | ||
The default specimen holder for the | The default specimen holder for the T20 is called Single-Tilt (FEI ST) and it is always present in building 314 Prep Room1. | ||
[[File:ST holder.jpg|300px]]<br /> | [[File:ST holder.jpg|300px]]<br /> | ||
The lab has also other specimen holders used for various application e.g. heating (furnace and MEMS-based), cooling, biasing and tomography. For information on the various specimen holders see [[LabAdviser/ | The lab has also other specimen holders used for various application e.g. heating (furnace and MEMS-based), cooling, biasing and tomography. For information on the various specimen holders see [[LabAdviser/314/Microscopy 314-307/TEM/Sample Holders|HERE]] | ||
== Who may operate the Tecnai T20 == | |||
Anybody in need of a TEM microscope is welcome to apply for access to our facility by submitting an [https://www.nanolab.dtu.dk/use-nanolab/use-of-our-facilities Access Request Form ].Shortly after your ARF has been received you will be contact by the microscopy support team in order to set up a meeting to further discuss your application.<br /> | |||
Anybody in need of a TEM microscope is welcome to apply for access to our facility by submitting an [ | In order to be authorised to use the Tecnai T20 you must complete the Tecnai training with consists of a theoretical lecture and 3 practical sessions of 4 hours each.<br /> | ||
In order to be authorised to use the Tecnai | |||
Due to the similarity of the basic operations on a Tecnai TEM and a Titan TEM, a Tecnai trained user can receive additional training and progress in using a Titan TEM.<br /> | Due to the similarity of the basic operations on a Tecnai TEM and a Titan TEM, a Tecnai trained user can receive additional training and progress in using a Titan TEM.<br /> | ||
When you have demonstrated a high level of familiarity with the Tecnai TEM you will be authorized and allowed to book it via our booking system called LabManager.<br /> | When you have demonstrated a high level of familiarity with the Tecnai TEM you will be authorized and allowed to book it via our booking system called LabManager.<br /> | ||
= Booking | == Booking == | ||
Booking on the T20 is done by the users in accordance to the booking rules. Booking rules can be found in LabManager under "Documents" for the T20. | |||
'''Further information''' | |||
[http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=348 TEM Tecnai T20 in LabManager] | |||
= Calibration = | |||
*Magnification calibration cameras | |||
*Collection angles GIF | |||
*Convergence angles STEM | |||
= Process information = | |||
The following techniques and processes are available on the microscope (list isn't complete): | |||
Techniques: | |||
*[[/BF|Bright Field Imaging]] | *[[/BF|Bright Field Imaging]] | ||
*[[/STEM|Scanning Transmission Electron Microscopy]] | *[[/STEM|Scanning Transmission Electron Microscopy]] | ||
*[[/DF|Diffraction]] | *[[/DF|Diffraction]] | ||
*[[LabAdviser/314/Microscopy 314-307/Technique/X-ray_spectroscopy|EDS/WDS]] | |||
*[[LabAdviser/314/Microscopy 314-307/Technique/EELS|EELS]] | |||
*[[LabAdviser/314/Microscopy 314-307/Technique/EFTEM|EFTEM]] | |||
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= Tips and Tricks = | |||
Here you can find some help to solve small issues on the microscope. Let us know, if you have other suggestions. | |||
*[[LabAdviser/314/Microscopy 314-307/TEM/Tips/MagicSwitch|Magic Switch is not working properly]] | |||
*[[LabAdviser/314/Microscopy 314-307/TEM/Tips/TVIPS camera|TVIPS camera]] | |||
*[[LabAdviser/314/Microscopy 314-307/TEM/Tips/Aztec|Aztec connection problems]] | |||
*[[LabAdviser/314/Microscopy 314-307/TEM/Tips/GIF-apertures|GIF apertures are not responding]] | |||
*[[LabAdviser/314/Microscopy 314-307/TEM/Tips/HAADF-detector|HAADF detector doesn't give a signal]] | |||
*[[LabAdviser/314/Microscopy 314-307/TEM/Tips/No-STEM|No buttons for STEM acquisition]] | |||
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= Reference material = | = Reference material = | ||
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David B. Williams, C. Barry Carter, Transmission Electron Microscopy - A Textbook for Materials Science (Springer, 2009). | David B. Williams, C. Barry Carter, Transmission Electron Microscopy - A Textbook for Materials Science (Springer, 2009). | ||
'''Online Material:''' | '''Online Material:''' | ||