Specific Process Knowledge/Characterization/XPS/Processing/Basics: Difference between revisions
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= XPS data processing guide = | = XPS data processing guide = | ||
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In case you want to follow along with your own analysis, you can download the data from [[Media:20150518_ZnO_CuZn_ZnO.doc| here (this file is a .zip file that has been renamed to .doc in order to be uploaded to LabAdviser, so download and rename to .zip and extract the files)]] | In case you want to follow along with your own analysis, you can download the data from [[Media:20150518_ZnO_CuZn_ZnO.doc| here (this file is a .zip file that has been renamed to .doc in order to be uploaded to LabAdviser, so download and rename to .zip and extract the files)]] | ||
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro|Survey spectra analysis]] | # [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro|Survey spectra analysis]] | ||
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## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro#Manually_add_peaks_to_identification_of_survey_spectra|Manual ID]] | ## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro#Manually_add_peaks_to_identification_of_survey_spectra|Manual ID]] | ||
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro#Make_a_depth_profile_from_survey_spectrum|Depth profile]] | ## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro#Make_a_depth_profile_from_survey_spectrum|Depth profile]] | ||
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres|High resolution spectra analysis]] | |||
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres|High resolution spectra analysis | ## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres#Selecting_high_resolution_spectra_for_peak_fitting|Open spectra]] | ||
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres| | ## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres#Peak_fitting|Peak fitting]] | ||
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres#Verify_correctness_of_fitting_routine|Ensure correct fitting parameters]] | |||
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres#Change_fitting_constraints|Apply constraints]] | |||
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/3fitting|Complete the analysis]] | # [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/3fitting|Complete the analysis]] | ||
Latest revision as of 15:50, 8 May 2023
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Unless otherwise stated, all content on this page was created by Jonas Michael-Lindhard, DTU Nanolab
XPS data processing guide
This section is intended as an introduction to the analysis of XPS data. Simple examples are chosen to illustrate the procedures. All actions performed with Avantage (version 5.498) during an analysis of a sample are shown.
In case you want to follow along with your own analysis, you can download the data from here (this file is a .zip file that has been renamed to .doc in order to be uploaded to LabAdviser, so download and rename to .zip and extract the files)