Specific Process Knowledge/Etch/DRIE-Pegasus/showerheadchange/polySi/Cduv: Difference between revisions
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| Pegasus/jmli | | Pegasus/jmli | ||
| 10 minute TDESC clean + 45 sec barc etch | | 10 minute TDESC clean + 45 sec barc etch | ||
| | | nanolab/jml/showerhead/polySi etch DUV mask, 20 cycles or 3:02 minutes | ||
| S004675 | | S004675 | ||
! Old showerhead | ! Old showerhead | ||
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| Pegasus/jmli | | Pegasus/jmli | ||
| 10 minute TDESC clean + 45 sec barc etch | | 10 minute TDESC clean + 45 sec barc etch | ||
| | | nanolab/jml/showerhead/polySi etch DUV mask, 20 cycles or 3:02 minutes | ||
| S004675 | | S004675 | ||
! New showerhead | |||
| | | | ||
|- | |- | ||
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Latest revision as of 10:12, 9 August 2022
Date | Substrate Information | Process Information | SEM Images | ||||||
---|---|---|---|---|---|---|---|---|---|
Wafer info | Mask | Material/ Exposed area | Tool / Operator | Conditioning | Recipe | Wafer ID | Comments | ||
20/11-2014 | 6" Wafer with 210 nm oxide and 1800 nm polysilicon | standard stepper mask (50 nm barc + 320 nm krf) | Si / 50+ % | Pegasus/jmli | 10 minute TDESC clean + 45 sec barc etch | nanolab/jml/showerhead/polySi etch DUV mask, 20 cycles or 3:02 minutes | S004675 | Old showerhead | |
1/12-2014 | 1/4 6" Wafer with 210 nm oxide and 1800 nm polysilicon crystalbonded on carrier | standard stepper mask (50 nm barc + 320 nm krf) | Si / 50+ % | Pegasus/jmli | 10 minute TDESC clean + 45 sec barc etch | nanolab/jml/showerhead/polySi etch DUV mask, 20 cycles or 3:02 minutes | S004675 | New showerhead |