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| == Comparing the three bonding methods in the EVG NIL ==
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| | '''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Bonding click here]''' |
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| | ==Bonding== |
| | For bonding samples to a carrier wafer in order to enable '''dry etching''', please go [[Specific_Process_Knowledge/Etch/DryEtchProcessing/Bonding|here]]. |
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| | For bonding samples to a carrier wafer for '''UV-lithography''' using automatic coater and developer, please see this process flow: [[media:Process_Flow_ChipOnCarrier.docx|Process_Flow_ChipOnCarrier.docx]], and refer to the [[Specific_Process_Knowledge/Etch/DryEtchProcessing/Bonding#Bonding|bonding procedure]] for dry etching. |
| |style="background:WhiteSmoke; color:black"|<b>[[/Eutectic bonding|Eutectic bonding]]</b>
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| |style="background:WhiteSmoke; color:black"|<b>[[/Fusion bonding|Fusion bonding]]</b>
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| |style="background:WhiteSmoke; color:black"|<b>[[/Anodic bonding|Anodic bonding]]</b>
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| !style="background:silver; width:100px; color:black;" align="center"|General description
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| For bonding two substrates by use of an interphase that makes an eutecticum.
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| For bonding two identical materials.
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| For bonding Si and Glass.
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| !style="background:silver; color:black" align="center" valign="center"|Bonding temperature
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| Depending on the eutecticum 310°C to 400°C.
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| Depending on defects 50°C to 400°C.
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| Depending on the voltage 300°C to 500°C Standard is 400°C.
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| !style="background:silver; color:black" align="center" valign="center"|Annealing temperature
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| No annealing
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| 1000°C in the bond furnace C3.
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| No annealing
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| !style="background:silver; color:black" align="center" valign="center"|Materials possible to bond
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| Bonding of substrates is done by use of the eutectica Au/Si, Au/Sn and Au/Sn/Ni
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| Si/Si, SiO2/SiO2
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| Si/Pyrex (glass)
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| !style="background:silver; color:black" align="center" valign="center"|Substrate size
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| Up to 6" (aligning only possible for 4" and 6")
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| Up to 6" (aligning only possible for 4" and 6")
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| Up to 6" (aligning only possible for 4" and 6")
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| !style="background:silver; color:black" align="center" valign="center"|Cleaning
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| Cleaning by N2.
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| Wet chemical cleaning, [[Specific Process Knowledge/Wafer cleaning/IMEC|IMEC]].
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| Cleaning by N2.
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| !style="background:silver; color:black" align="center" valign="center"|IR alignment
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| Double side polished wafers.
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| Double side polished wafers.
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| Not relevant.
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| == Choose equipment == | | == Choose equipment == |
| *[[/EVG NIL|EVG NIL]] | | *[[/Imprinter 02|Imprinter 02]] |
| | *[[/Wafer Bonder 02|Wafer Bonder 02]] |
| *[[Specific Process Knowledge/Thermal Process/C3 Anneal-bond furnace|C3 furnace anneal bond]] | | *[[Specific Process Knowledge/Thermal Process/C3 Anneal-bond furnace|C3 furnace anneal bond]] |
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| == Choose bonding methods in EVG NIL == | | == Choose bonding methods in Wafer Bonder 2 == |
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| *[[/Eutectic bonding|Eutectic bonding]] | | *[[/Eutectic bonding|Eutectic bonding]] |
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| *[[/Anodic bonding|Anodic bonding]] | | *[[/Anodic bonding|Anodic bonding]] |
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| == Comparing the three bonding methods in the EVG NIL == | | == Comparing the three bonding methods in the wafer bonder 2 == |
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| {| border="2" cellspacing="0" cellpadding="2" | | {| border="2" cellspacing="0" cellpadding="2" |
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| !colspan="1" border="none" style="background:silver; color:black;" align="center"|
| | |-style="background:silver; color:black" |
| |style="background:WhiteSmoke; color:black"|<b>[[/Eutectic bonding|Eutectic bonding]]</b>
| | ! |
| |style="background:WhiteSmoke; color:black"|<b>[[/Fusion bonding|Fusion bonding]]</b>
| | ![[/Eutectic bonding|Eutectic bonding]] |
| |style="background:WhiteSmoke; color:black"|<b>[[/Anodic bonding|Anodic bonding]]</b>
| | ![[/Fusion bonding|Fusion bonding]] |
| | ![[/Anodic bonding|Anodic bonding]] |
| |- | | |- |
| !style="background:silver; width:100px; color:black;" align="center"|General description
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| |style="background:WhiteSmoke; color:black"| | | |-style="background:WhiteSmoke; color:black" |
| For bonding two substrates by use of an interphase that makes an eutecticum. | | !General description |
| |style="background:WhiteSmoke; color:black"| | | |For bonding two substrates by use of an interphase that makes an eutecticum. |
| For bonding two identical materials. | | |For bonding two identical materials. |
| |style="background:WhiteSmoke; color:black"| | | |For bonding Si and Glass. |
| For bonding Si and Glass. | |
| |- | | |- |
| !style="background:silver; color:black" align="center" valign="center"|Bonding temperature
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| |style="background:WhiteSmoke; color:black"| | | |-style="background:silver; color:black" |
| Depending on the eutecticum 310°C to 400°C. | | !Bonding temperature |
| |style="background:WhiteSmoke; color:black"| | | |Depending on the eutecticum 310°C to 400°C. |
| Depending on defects 50°C to 400°C. | | |Depending on defects 50°C to 400°C. |
| |style="background:WhiteSmoke; color:black"| | | |Depending on the voltage 300°C to 500°C Standard is 400°C. |
| Depending on the voltage 300°C to 500°C Standard is 400°C. | |
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| !style="background:silver; color:black" align="center" valign="center"|Annealing temperature
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| |style="background:WhiteSmoke; color:black"| | | !Annealing temperature |
| No annealing | | |No annealing |
| |style="background:WhiteSmoke; color:black"| | | |1000°C-1100°C in the anneal bond furnace (C3). |
| 1000°C in the bond furnace C3. | | |No annealing |
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| No annealing | |
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| !style="background:silver; color:black" align="center" valign="center"|Materials possible to bond
| | |-style="background:silver; color:black" |
| |style="background:WhiteSmoke; color:black"| | | !Materials possible to bond |
| Bonding of substrates is done by use of the eutectica Au/Si, Au/Sn and Au/Sn/Ni | | |Bonding of substrates is done by use of the eutectica Au/Si, Au/Sn and Au/Sn/Ni |
| |style="background:WhiteSmoke; color:black"| | | |Si/Si, SiO2/SiO2 |
| Si/Si, SiO2/SiO2 | | |Si/Pyrex (glass) |
| |style="background:WhiteSmoke; color:black"| | |
| Si/Pyrex (glass) | |
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| !style="background:silver; color:black" align="center" valign="center"|Substrate size
| | |-style="background:WhiteSmoke; color:black" |
| |style="background:WhiteSmoke; color:black"| | | !Substrate size |
| Up to 6" (aligning only possible for 4" and 6") | | |Up to 4" |
| |style="background:WhiteSmoke; color:black"| | | |Up to 4" |
| Up to 6" (aligning only possible for 4" and 6") | | |Up to 4" |
| |style="background:WhiteSmoke; color:black"| | |
| Up to 6" (aligning only possible for 4" and 6") | |
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| !style="background:silver; color:black" align="center" valign="center"|Cleaning
| | |-style="background:silver; color:black" |
| |style="background:WhiteSmoke; color:black"| | | !Cleaning |
| Cleaning by N2. | | |Cleaning by N2. |
| |style="background:WhiteSmoke; color:black"| | | |Wet chemical cleaning, [[Specific Process Knowledge/Wafer cleaning/IMEC|IMEC]]. |
| Wet chemical cleaning, [[Specific Process Knowledge/Wafer cleaning/IMEC|IMEC]]. | | |Cleaning by N2. |
| |style="background:WhiteSmoke; color:black"| | |
| Cleaning by N2. | |
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| !style="background:silver; color:black" align="center" valign="center"|IR alignment
| | |-style="background:WhiteSmoke; color:black" |
| |style="background:WhiteSmoke; color:black"| | | !Backside alignment |
| Double side polished wafers. | | |Double side polished wafers. |
| |style="background:WhiteSmoke; color:black"| | | |Double side polished wafers. |
| Double side polished wafers. | | |Not relevant. |
| |style="background:WhiteSmoke; color:black"| | |
| Not relevant. | |
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| <br clear="all" /> | | <br clear="all" /> |