Specific Process Knowledge/Etch/Etching of SU-8: Difference between revisions
No edit summary |
No edit summary |
||
(22 intermediate revisions by 2 users not shown) | |||
Line 1: | Line 1: | ||
SU-8 can be etched by a oxygen plasma with a small amount of SF<sub>6</sub> to remove the antimony present from the photo initiator. | <!--Checked for updates on 30/7-2018 - ok/jmli --> | ||
<!--Page reviewed by jmli 9/8-2022 --> | |||
==Etching of SU-8== | |||
SU-8 can be etched by a oxygen plasma with a small amount of SF<sub>6</sub> to remove the antimony present from the photo initiator. Etching of SU-8 has been developed on the ASE and was tested as a mask less reduction of patterns defined by photo lithography. Two processes are available, a high and a low anisotropic etch for use as etching or thinning of structures. | |||
* High anisotropic etch: etch rate ~400nm/min, anisotropy ~0.8 | |||
* Low anisotropic etch: etch rate ~170nm/min, anisotropy ~0.3 | |||
==Recipes in ASE== | |||
===SU8aniso=== | |||
The anisotropic SU8aniso etch was design to etch structures in SU-8 with a low roughness of the etched surface, however it has not been tested with any mask material. For a polymeric mask a low selectivity is expected. The etch rate was measured to around 400 nm/min, but will depend on wafer coverage. The surface layer concentration of antimony (Sb) after etch is expected to be below 2%. | |||
{| border="2" cellpadding="2" cellspacing="1" style="text-align:center;" | |||
|+ '''SU8aniso and SU8iso etches''' by khara@nanolab | |||
|- | |||
! Parameter | |||
! SU8aniso etch | |||
! SU8iso etch | |||
|- | |||
! O<sub>2</sub> (sccm) | |||
| 99 | |||
| 99 | |||
|- | |||
! SF<sub>6</sub> (sccm) | |||
| 17 | |||
| 14 | |||
|- | |||
! Pressure (mTorr) | |||
| 40 | |||
| 20 | |||
|- | |||
! Coil power (W) | |||
| 800 | |||
| 800 | |||
|- | |||
! Platen power (W) | |||
| 30 | |||
| 0 | |||
|- | |||
! Temperature (<sup>o</sup>C) | |||
| 30 | |||
| 10 | |||
|- | |||
! Etch rate (nm/min) | |||
| ~400 | |||
| ~170 | |||
|- | |||
!anisotropy | |||
| ~0.8 | |||
| ~0.3 | |||
|- | |||
!Sb in surface layer (%) | |||
| <2 | |||
| <2.75 | |||
|} | |||
===SU8iso=== | |||
The SU8iso etch was developed for thinning of lithography defined structures to gain higher aspect ratio or thinner structures than possible with photo lithography. | |||
==Roughness and antimony effects in SU-8 etching== | |||
{| border="1" cellspacing="1" cellpadding="2" align="left" | |||
! SU-8 lines by lithography | |||
! Oxygen etch | |||
! SU8aniso | |||
! SU8iso | |||
|- | |||
|[[Image:SU8-noetch Q13.jpg|200x200px]] | |||
|[[Image:SU8-oxygen-etch_Q12.jpg|200x200px]] | |||
|[[Image:SU8-SU8aniso_R15.jpg|200x200px]] | |||
|[[Image:SU8-SU8iso_R13.jpg|200x200px]] | |||
|- | |||
|No etching | |||
|Etch | |||
*O<sub>2</sub> flow [sccm]:99 | |||
*SF<sub>6</sub> flow [sccm]:0 | |||
*Pressure [mTorr]:20 | |||
*Coil power [W]:800 | |||
*Platen power [W]:30 | |||
*Temperature [°C]:10 | |||
|Etch | |||
*O<sub>2</sub> flow [sccm]:99 | |||
*SF<sub>6</sub> flow [sccm]:17 | |||
*Pressure [mTorr]:40 | |||
*Coil power [W]:800 | |||
*Platen power [W]:30 | |||
*Temperature [°C]:30 | |||
|Etch | |||
*O<sub>2</sub> flow [sccm]:99 | |||
*SF<sub>6</sub> flow [sccm]:14 | |||
*Pressure [mTorr]:20 | |||
*Coil power [W]:800 | |||
*Platen power [W]:0 | |||
*Temperature [°C]:10 | |||
|} |
Latest revision as of 10:09, 9 August 2022
Etching of SU-8
SU-8 can be etched by a oxygen plasma with a small amount of SF6 to remove the antimony present from the photo initiator. Etching of SU-8 has been developed on the ASE and was tested as a mask less reduction of patterns defined by photo lithography. Two processes are available, a high and a low anisotropic etch for use as etching or thinning of structures.
- High anisotropic etch: etch rate ~400nm/min, anisotropy ~0.8
- Low anisotropic etch: etch rate ~170nm/min, anisotropy ~0.3
Recipes in ASE
SU8aniso
The anisotropic SU8aniso etch was design to etch structures in SU-8 with a low roughness of the etched surface, however it has not been tested with any mask material. For a polymeric mask a low selectivity is expected. The etch rate was measured to around 400 nm/min, but will depend on wafer coverage. The surface layer concentration of antimony (Sb) after etch is expected to be below 2%.
Parameter | SU8aniso etch | SU8iso etch |
---|---|---|
O2 (sccm) | 99 | 99 |
SF6 (sccm) | 17 | 14 |
Pressure (mTorr) | 40 | 20 |
Coil power (W) | 800 | 800 |
Platen power (W) | 30 | 0 |
Temperature (oC) | 30 | 10 |
Etch rate (nm/min) | ~400 | ~170 |
anisotropy | ~0.8 | ~0.3 |
Sb in surface layer (%) | <2 | <2.75 |
SU8iso
The SU8iso etch was developed for thinning of lithography defined structures to gain higher aspect ratio or thinner structures than possible with photo lithography.