Specific Process Knowledge/Lithography/EBeamLithography/HSQ Dose Test: Difference between revisions
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= HSQ Dose Test = | |||
== | = Resist info = | ||
* we used a 10 % HSQ resist for a dose test. The resist info sheet could be found [https://www.emresist.com/web/content/16597 her]. | |||
* spinning: in labspin 3000rpm for 40s with 2s ramp (1500 acceleration) then bake for 2 min at 165 C | |||
* Exposure: At 12nA ap6 (spot size 10 nm) in JEOL 9500 | |||
** Dose test with structures (3x3) | |||
** Develop for 90s using manual TMAH developer | |||
** Optical and SEM images and analysis | |||
= Results = | |||
Below is overview optical images of the developed pattern: | |||
[[File:Dose test optical.png|frameless|625x625px|dose test optical images|left]] | |||
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SEM images were recorded and analyzed from the structure shown below: The numbers indicate the line width and pitch. | |||
[[File:design.png|frameless|left|341x341px]] | |||
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The measured and designed critical dimension are plotted vs the doses below: | |||
[[File:CD vs dose.png|frameless|548x548px|dose test optical images|left]] | |||
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The line width roughness (LWR) is plotted vs CD below: | |||
[[File:LWR vs CD.png|frameless|558x558px|dose test optical images|left]] | |||