Specific Process Knowledge/Etch/Etching of Silicon: Difference between revisions
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== Comparing silicon etch methods == | |||
There are a broad variety of silicon etch methods at DTU Nanolab The methods are compared here to make it easier for you to compare and choose the one that suits your needs. | |||
There are a broad | |||
===Wet etches:=== | ===Wet etches:=== | ||
*[[Specific Process Knowledge/Etch/KOH Etch|KOH | *[[Specific Process Knowledge/Etch/KOH Etch|Si Etch: KOH]] | ||
*[[Specific Process Knowledge/Etch/Wet Polysilicon Etch|Wet PolySilicon etch]] | *[[Specific Process Knowledge/Etch/Wet Polysilicon Etch|Wet PolySilicon etch]] | ||
===Dry etches:=== | ===Dry etches:=== | ||
*[[/Si etch using | *[[/Si etch using ASE|Si etch using ASE (Advanced Silicon Etch)]] | ||
*[[Specific Process Knowledge/Etch/DRIE-Pegasus|Si etch using DRIE-Pegasus (Silicon Etch)]] | |||
*[[Specific Process Knowledge/Etch/DRIE-Pegasus|DRIE-Pegasus (Silicon Etch)]] | *[[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300/IBE Si etch|Si etch using IBE/IBSD Ionfab 300]] | ||
*[[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE/IBSD Ionfab 300]] | |||
==Compare the | ==Compare the methods for Si etching== | ||
{|border="1" cellspacing="1" cellpadding="3" style="text-align:left;" | {|border="1" cellspacing="1" cellpadding="3" style="text-align:left;" | ||
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! | ! | ||
![[Specific Process Knowledge/Etch/KOH Etch| | ![[Specific Process Knowledge/Etch/KOH Etch|Si Etch]] | ||
![[Specific Process Knowledge/Etch/Wet Polysilicon Etch|Wet PolySilicon etch]] | ![[Specific Process Knowledge/Etch/Wet Polysilicon Etch|Wet PolySilicon etch]] | ||
![[Specific Process Knowledge/Etch/DRIE-Pegasus|DRIE-Pegasus (Deep Reactive Ion Etch)]] | |||
![[Specific Process Knowledge/Etch/DRIE-Pegasus|DRIE-Pegasus ( | |||
![[Specific Process Knowledge/Etch/ASE (Advanced Silicon Etch)|ASE (Advanced Silicon Etch)]] | ![[Specific Process Knowledge/Etch/ASE (Advanced Silicon Etch)|ASE (Advanced Silicon Etch)]] | ||
![[Specific Process Knowledge/Etch/ICP Metal Etcher|ICP Metal Etch]] | ![[Specific Process Knowledge/Etch/ICP Metal Etcher|ICP Metal Etch]] | ||
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!Generel description | !Generel description | ||
| | | | ||
*Anisotropic etch in | *Anisotropic etch in crystalline silicon | ||
*High selectivity to the | *High selectivity to the {111}-planes | ||
| | | | ||
* | *Isotropic etch in crystalline silicon and polysilicon | ||
| | | | ||
*State-of-the-art dry silicon etcher with atmospheric cassette loader | *State-of-the-art dry silicon etcher with atmospheric cassette loader | ||
*Good selectivity to photoresist | |||
*Extremely high etch rate and advanced processing options | *Extremely high etch rate and advanced processing options | ||
| | | | ||
* | *Can etch isotropic and anisotropic depending on the process parameters and mask design | ||
*Good selectivity to photoresist | *Good selectivity to photoresist | ||
*The ASE open for same metal on the samples and SiO2 etching, which can affect the Si etch stability. | |||
| | | | ||
* | *This is dedicated to metal etch. So fare only Si etch of nanostructures has been explored on the system. | ||
| | | | ||
*Primarily for pure physical etch by sputtering with Ar-ions | *Primarily for pure physical etch by sputtering with Ar-ions | ||
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*Silicon Oxide | *Silicon Oxide | ||
| | | | ||
* | *Photo-, DUV- and e-beamresist | ||
*E-beam resist | *E-beam resist | ||
*Silicon Oxide | *Silicon Oxide | ||
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*Other metals if they cover less than 5% of the wafer area (ONLY RIE2!) | *Other metals if they cover less than 5% of the wafer area (ONLY RIE2!) | ||
| | | | ||
* | *Photo-, DUV- and e-beamresist | ||
*Silicon Oxide | *Silicon Oxide | ||
*Silicon Nitride | *Silicon Nitride | ||
*Aluminium oxide | *Aluminium oxide | ||
| | | | ||
* | *Photo-, DUV- and e-beamresist | ||
*Silicon Oxide | *Silicon Oxide | ||
*Silicon Nitride | *Silicon Nitride | ||
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| | | | ||
*~100-200 nm/min, highly dependent on doping level | *~100-200 nm/min, highly dependent on doping level | ||
| | | | ||
*Up to 18-20 µm/min depending on recipe, mask design and aspect ratio. | *Up to 18-20 µm/min depending on recipe, mask design and aspect ratio. | ||
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*<130nm/min to >5.6 µm/min depending on recipe, mask design and aspect ratio. | *<130nm/min to >5.6 µm/min depending on recipe, mask design and aspect ratio. | ||
| | | | ||
* | *Process dependent. The nano etch is in the range 59-311 nm/min | ||
| | | | ||
* | *Process dependent. Has been tested in the range 17-31 nm/min | ||
|- | |- | ||
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!Substrate size | !Substrate size | ||
| | | | ||
*25 wafers of 100mm in | *<nowiki>#</nowiki>25 wafers of 100mm or 150nm in Si Etch 1 & 2 | ||
*<nowiki>#</nowiki>25 wafers of 100mm or 150nm and smaller samples in Si Etch 3 (fume hood) | |||
*25 wafers of 100mm or | |||
| | | | ||
*<nowiki>#</nowiki>25 | *<nowiki>#</nowiki>#25 wafers of 100mm or 150nm mm wafers | ||
| | | | ||
*As many small samples as can be fitted on the 100mm carrier. | *As many small samples as can be fitted on the 100mm carrier. | ||
*1 100mm wafer (or smaller with carrier) | *<nowiki>#</nowiki>1 100mm wafer (or smaller with carrier) | ||
*1 150mm wafer (only when the system is set up for 150mm) | *<nowiki>#</nowiki>1 150mm wafer (only when the system is set up for 150mm) | ||
| | | | ||
*As many small samples as can be fitted on a 100mm wafer | *As many small samples as can be fitted on a 100mm wafer | ||
*1 50 mm wafer fitted on a 100mm wafer | *<nowiki>#</nowiki>1 50 mm wafer fitted on a 100mm wafer | ||
*1 100 mm wafer | *<nowiki>#</nowiki>1 100 mm wafer | ||
*1 150 mm wafers (only when the system is set up to 150mm) | *<nowiki>#</nowiki>1 150 mm wafers (only when the system is set up to 150mm) | ||
| | | | ||
*As many small samples as can be fitted on a | *As many small samples as can be fitted on a 150mm wafer | ||
* | *<nowiki>#</nowiki>5 50 mm wafers fitted on a 150mm wafer | ||
*1 100 mm wafer | *<nowiki>#</nowiki>1 100 mm wafer on a 150mm wafer | ||
*<nowiki>#</nowiki>1 150 mm wafers (The system is normally set up to 150mm) | |||
*1 150 mm wafers ( | |||
| | | | ||
*As many samples as can be securely fitted on a up to 200mm wafer | *As many samples as can be securely fitted on a up to 200mm wafer | ||
*1 50 mm wafer | *<nowiki>#</nowiki>1 50 mm wafer with special carrier | ||
*1 100 mm wafer | *<nowiki>#</nowiki>1 100 mm wafer with special carrier | ||
*1 150 mm wafers | *<nowiki>#</nowiki>1 150 mm wafers with special carrier | ||
*1 200 mm wafer | *<nowiki>#</nowiki>1 200 mm wafer | ||
|- | |- | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
!'''Allowed materials''' | !'''Allowed materials''' | ||
| | | | ||
* | *Silicon | ||
* | *Silicon Oxide | ||
*Silicon Nitride | |||
*Silicon Oxynitride | |||
*Other materials (only in "Si Etch 3 (fume hood)) | |||
| | | | ||
* | *Silicon | ||
* | *Silicon Oxide | ||
* | *Silicon Nitride | ||
*Silicon Oxynitride | |||
*Photoresist | |||
| | | | ||
* | *Silicon | ||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Silicon Oxynitride | |||
*Photo-, DUV- and e-beamresist | |||
*Aluminium oxide | |||
*Quartz/fused silica | |||
| | |||
*Silicon | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Silicon Oxynitride | |||
*Photo-, DUV- and e-beamresist | |||
*Aluminium | |||
*Quartz/fused silica | |||
*Other metals if they cover less than 5% of the wafer area | |||
| | | | ||
* | *Silicon | ||
* | *Photo-, DUV- and e-beamresist | ||
* | *PolySilicon | ||
*Silicon oxide | |||
*Silicon (oxy)nitride | |||
*Aluminium | |||
*Titanium | |||
*Chromium | |||
*Quartz/fused silica | |||
| | | | ||
* | *Silicon | ||
* | *Silicon oxides | ||
* | *Silicon (oxy)nitrides | ||
*Metals from the +list | |||
*Metals from the -list | |||
*Alloys from the above list | |||
*Stainless steel | |||
*Glass | |||
*III-V materials | |||
*Resists | |||
*Polymers | |||
*Capton tape | |||
|- | |- | ||
|} | |} | ||
<br clear="all" /> | <br clear="all" /> | ||