Specific Process Knowledge/Etch/Etching of Silicon: Difference between revisions
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Etch of silicon | '''Unless anything else is stated, everything on this page, text and pictures are made by DTU Nanolab.''' | ||
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== Comparing silicon etch methods == | |||
There are a broad variety of silicon etch methods at DTU Nanolab The methods are compared here to make it easier for you to compare and choose the one that suits your needs. | |||
===Wet etches:=== | ===Wet etches:=== | ||
*[[Specific Process Knowledge/Etch/KOH Etch|KOH | *[[Specific Process Knowledge/Etch/KOH Etch|Si Etch: KOH]] | ||
*[[Specific Process Knowledge/Etch/Wet Polysilicon Etch|Wet PolySilicon etch]] | *[[Specific Process Knowledge/Etch/Wet Polysilicon Etch|Wet PolySilicon etch]] | ||
===Dry etches:=== | ===Dry etches:=== | ||
*[[/Si etch using | *[[/Si etch using ASE|Si etch using ASE (Advanced Silicon Etch)]] | ||
*[[/Si etch using | *[[Specific Process Knowledge/Etch/DRIE-Pegasus|Si etch using DRIE-Pegasus (Silicon Etch)]] | ||
*[[Specific Process Knowledge/Etch/DRIE-Pegasus|DRIE-Pegasus (Silicon Etch)]] | *[[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300/IBE Si etch|Si etch using IBE/IBSD Ionfab 300]] | ||
==Compare the methods for Si etching== | |||
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! | |||
![[Specific Process Knowledge/Etch/KOH Etch|Si Etch]] | |||
![[Specific Process Knowledge/Etch/Wet Polysilicon Etch|Wet PolySilicon etch]] | |||
![[Specific Process Knowledge/Etch/DRIE-Pegasus|DRIE-Pegasus (Deep Reactive Ion Etch)]] | |||
![[Specific Process Knowledge/Etch/ASE (Advanced Silicon Etch)|ASE (Advanced Silicon Etch)]] | |||
![[Specific Process Knowledge/Etch/ICP Metal Etcher|ICP Metal Etch]] | |||
![[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE/IBSD Ionfab 300]] | |||
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|-style="background:WhiteSmoke; color:black" | |||
!Generel description | |||
|- | |||
| | | | ||
*Anisotropic etch in | *Anisotropic etch in crystalline silicon | ||
*High selectivity to the | *High selectivity to the {111}-planes | ||
| | | | ||
*Isotropic etch in | *Isotropic etch in crystalline silicon and polysilicon | ||
| | | | ||
* | *State-of-the-art dry silicon etcher with atmospheric cassette loader | ||
* | *Good selectivity to photoresist | ||
*Extremely high etch rate and advanced processing options | |||
| | | | ||
* | *Can etch isotropic and anisotropic depending on the process parameters and mask design | ||
*Good selectivity to photoresist | *Good selectivity to photoresist | ||
*The ASE open for same metal on the samples and SiO2 etching, which can affect the Si etch stability. | |||
| | | | ||
* | *This is dedicated to metal etch. So fare only Si etch of nanostructures has been explored on the system. | ||
* | | | ||
|- | *Primarily for pure physical etch by sputtering with Ar-ions | ||
|- | |||
|- | |||
|-style="background:LightGrey; color:black" | |||
!Possible masking materials | |||
| | | | ||
*Silicon Nitride | *Silicon Nitride | ||
*Silicon Oxide | *Silicon Oxide | ||
| | | | ||
* | *Photo-, DUV- and e-beamresist | ||
*E-beam resist | *E-beam resist | ||
*Silicon Oxide | *Silicon Oxide | ||
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*Other metals if they cover less than 5% of the wafer area (ONLY RIE2!) | *Other metals if they cover less than 5% of the wafer area (ONLY RIE2!) | ||
| | | | ||
* | *Photo-, DUV- and e-beamresist | ||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Aluminium oxide | |||
| | |||
*Photo-, DUV- and e-beamresist | |||
*Silicon Oxide | *Silicon Oxide | ||
*Silicon Nitride | *Silicon Nitride | ||
*Aluminium | *Aluminium | ||
| | | | ||
* | *Photo-, DUV- and e-beamresist | ||
*Silicon Oxide | *Silicon Oxide | ||
*Silicon Nitride | *Silicon Nitride | ||
*Aluminium | *Aluminium | ||
|- | *Cr | ||
*Ti | |||
| | |||
*Any material that is accepted in the machine | |||
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|- | |||
|-style="background:WhiteSmoke; color:black" | |||
!Etch rate range | |||
| | | | ||
*Si(100) @80<sup>o</sup>C: 1.29+0.05 µm/min | *Si(100) @80<sup>o</sup>C: 1.29+0.05 µm/min | ||
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*~100-200 nm/min, highly dependent on doping level | *~100-200 nm/min, highly dependent on doping level | ||
| | | | ||
* | *Up to 18-20 µm/min depending on recipe, mask design and aspect ratio. | ||
| | | | ||
*<130nm/min to >5.6 µm/min depending on recipe, mask design and aspect ratio. | *<130nm/min to >5.6 µm/min depending on recipe, mask design and aspect ratio. | ||
| | | | ||
* | *Process dependent. The nano etch is in the range 59-311 nm/min | ||
| | | | ||
* | *Process dependent. Has been tested in the range 17-31 nm/min | ||
|- | |||
|- | |||
|-style="background:LightGrey; color:black" | |||
!Substrate size | |||
| | | | ||
* | *<nowiki>#</nowiki>25 wafers of 100mm or 150nm in Si Etch 1 & 2 | ||
*<nowiki>#</nowiki>25 wafers of 100mm or 150nm and smaller samples in Si Etch 3 (fume hood) | |||
| | | | ||
* | *<nowiki>#</nowiki>#25 wafers of 100mm or 150nm mm wafers | ||
| | | | ||
* | *As many small samples as can be fitted on the 100mm carrier. | ||
*<nowiki>#</nowiki>1 100mm wafer (or smaller with carrier) | |||
*<nowiki>#</nowiki>1 150mm wafer (only when the system is set up for 150mm) | |||
| | | | ||
* | *As many small samples as can be fitted on a 100mm wafer | ||
*<nowiki>#</nowiki>1 50 mm wafer fitted on a 100mm wafer | |||
*<nowiki>#</nowiki>1 100 mm wafer | |||
*<nowiki>#</nowiki>1 150 mm wafers (only when the system is set up to 150mm) | |||
| | | | ||
* | *As many small samples as can be fitted on a 150mm wafer | ||
*1 | *<nowiki>#</nowiki>5 50 mm wafers fitted on a 150mm wafer | ||
*<nowiki>#</nowiki>1 100 mm wafer on a 150mm wafer | |||
*<nowiki>#</nowiki>1 150 mm wafers (The system is normally set up to 150mm) | |||
| | | | ||
* | *As many samples as can be securely fitted on a up to 200mm wafer | ||
*<nowiki>#</nowiki>1 50 mm wafer with special carrier | |||
* | *<nowiki>#</nowiki>1 100 mm wafer with special carrier | ||
*<nowiki>#</nowiki>1 150 mm wafers with special carrier | |||
* | *<nowiki>#</nowiki>1 200 mm wafer | ||
| | |- | ||
|-style="background:WhiteSmoke; color:black" | |||
|- | !'''Allowed materials''' | ||
| | | | ||
*Silicon | *Silicon | ||
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*Silicon Nitride | *Silicon Nitride | ||
*Silicon Oxynitride | *Silicon Oxynitride | ||
*Other materials (only in " | *Other materials (only in "Si Etch 3 (fume hood)) | ||
| | | | ||
*Silicon | *Silicon | ||
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*Silicon Nitride | *Silicon Nitride | ||
*Silicon Oxynitride | *Silicon Oxynitride | ||
* | *Photo-, DUV- and e-beamresist | ||
*Aluminium oxide | |||
*Aluminium | *Quartz/fused silica | ||
* | |||
| | | | ||
*Silicon | *Silicon | ||
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*Silicon Nitride | *Silicon Nitride | ||
*Silicon Oxynitride | *Silicon Oxynitride | ||
* | *Photo-, DUV- and e-beamresist | ||
*Aluminium | *Aluminium | ||
*Quartz/fused silica | |||
*Other metals if they cover less than 5% of the wafer area | |||
| | | | ||
*Silicon | *Silicon | ||
* | *Photo-, DUV- and e-beamresist | ||
* | *PolySilicon | ||
*Silicon | *Silicon oxide | ||
* | *Silicon (oxy)nitride | ||
* | *Aluminium | ||
* | *Titanium | ||
*Chromium | |||
*Quartz/fused silica | |||
* | |||
* | |||
| | | | ||
* | *Silicon | ||
* | *Silicon oxides | ||
*Silicon (oxy)nitrides | |||
*Metals from the +list | |||
* | *Metals from the -list | ||
*Alloys from the above list | |||
*Stainless steel | |||
*Glass | |||
*III-V materials | |||
*Resists | |||
* | *Polymers | ||
*Capton tape | |||
* | |||
* | |||
* | |||
* | |||
* | |||
* | |||
* | |||
* | |||
|- | |- | ||
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