Specific Process Knowledge/Etch/III-V RIE: Difference between revisions
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'''Feedback to this page''': '''[mailto:labadviser@ | '''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php?title=Specific_Process_Knowledge/Etch/III-V_RIE click here]'''<br> | ||
==III-V RIE Plassys== | '''''Unless otherwise stated, this page is written by DTU Nanolab internal''''' | ||
==III-V RIE Plassys <span style="background:#ff0000"> This tool has been decommissioned - please ask the dryetch group for alternatives.</span>== | |||
===(will be decommissioned October 2025)=== | |||
Name: MG300 RIE <br> | Name: MG300 RIE <br> | ||
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== General information == | == General information == | ||
[[Image:III-V RIE Plassys.jpg|right|250px|thumb| III-V RIE is | [[Image:III-V RIE Plassys.jpg|right|250px|thumb| III-V RIE is located in room A-1]] | ||
Dry etching of III-V compound semiconductors is performed with a conventional Reactive Ion Etch (RIE) located in cleanroom 1. The III-V RIE is a Plassys model MG300. Find the company website her: [http://www.plassys.com/ Plassys]. | Dry etching of III-V compound semiconductors is performed with a conventional Reactive Ion Etch (RIE) located in cleanroom A-1. The III-V RIE is a Plassys model MG300. Find the company website her: [http://www.plassys.com/ Plassys]. | ||
The system is equipped with a laser interferometer to monitor etch-rate and -depth. | The system is equipped with a laser interferometer to monitor etch-rate and -depth. | ||
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The diameter of the quartz plate is 20 cm, ie up to | The diameter of the quartz plate is 20 cm with a recess for 4" wafers, ie up to one 4" wafer, one 3" wafer or one 2" wafer or several smaller samples can be processed simultaneously. To strike a plasma, the applied power should be 50 W or more; if a process needs a lower power during etch it is necessary to initially strike the plasma with eg 50 W (higher powers are needed for lower gas pressures) for 5-10 sec where after the power can be lowered to the desired value. | ||
The chamber should be cleaned after '''all''' usage of the machine; read more under [[/III_V_RIE_ETCHES#Chamber Cleaning|Chamber Cleaning]]. | The chamber should be cleaned after '''all''' usage of the machine; read more under [[/III_V_RIE_ETCHES#Chamber Cleaning|Chamber Cleaning]]. | ||
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|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*SiO<sub>2</sub> | *SiO<sub>2</sub> | ||
*Si<sub>3</sub> | *Si<sub>3</sub>N<sub>4</sub> | ||
*BCB | *BCB | ||
*Resist | *Resist | ||
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*Resist: ~30-98 nm/min (AZ5206 and ZEP520A), ~70-815 nm/min (AZ5214) | *Resist: ~30-98 nm/min (AZ5206 and ZEP520A), ~70-815 nm/min (AZ5214) | ||
*InP: ~29 nm/min | *InP: ~29 nm/min | ||
* | *InGaAs: ~9 nm/min | ||
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|style="background:LightGrey; color:black"|Anisotropy | |style="background:LightGrey; color:black"|Anisotropy | ||
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*20 cm | *20 cm | ||
|- | |- | ||
| style="background:LightGrey; color:black"| | | style="background:LightGrey; color:black"|Material allowed | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
* III-V compound semiconductors | * III-V compound semiconductors | ||
* Silicon based materials | |||
* Photoresist/e-beam resist | |||
* BCB | |||
*Photoresist/e-beam resist | * For other materials, please ask | ||
* | |||
|- | |- | ||
|} | |} | ||