LabAdviser/314/Microscopy 314-307/TEM/T20: Difference between revisions
Appearance
mNo edit summary Tags: Manual revert Visual edit: Switched |
|||
| (31 intermediate revisions by the same user not shown) | |||
| Line 1: | Line 1: | ||
<span style="background:#FF2800">THIS PAGE IS UNDER CONSTRUCTION</span>[[image:Under_construction.png|200px]] | <!-- <span style="background:#FF2800">THIS PAGE IS UNDER CONSTRUCTION</span>[[image:Under_construction.png|200px]] --> | ||
'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php?title=LabAdviser/314/Microscopy_314-307/TEM/T20 click here]''' | |||
''This section is written by DTU Nanolab internal if nothing else is stated.'' | |||
[[Category:314]] | |||
[[Category:314-Microscopy]] | |||
[[File:IMG_2076.JPG|400x400px|right|thumb|Tecnai T20 in building 314.]] | [[File:IMG_2076.JPG|400x400px|right|thumb|Tecnai T20 in building 314.]] | ||
= FEI Tecnai T20 = | = FEI Tecnai T20 = | ||
DTU Nanolabs Tecnai T20 is a transmission electron microscope (TEM) used for performing both conventional, high resolution and scanning transmission microscopy (STEM) measurements. It is a versatile instrument, ideal for studying a wide range of general and advanced materials, soft matter, composites, etc. The microscope is equipped to carry out chemical analysis as well as Cryo-TEM for soft materials.<br /> | DTU Nanolabs Tecnai T20 is a transmission electron microscope (TEM) used for performing both conventional imaging and diffraction, high resolution and scanning transmission microscopy (STEM) measurements. It is a versatile instrument, ideal for studying a wide range of general and advanced materials, soft matter, composites, etc. The microscope is equipped to carry out chemical analysis as well as Cryo-TEM for soft materials.<br /> | ||
The Tecnai T20 is a transmission electron microscope equipped with a thermionic electron source with a Lab6 filament and acceleration voltages that can vary between 80-200 kV. This gives the microscope a resolution @ 200 kV of 1.4 Å in TEM mode. Other tecniques available on the microscope are scanning transmission electron microscopy (STEM, resolution 10 Å) with a high-angle annular dark-field detector (HAADF).<br /> | The Tecnai T20 is a transmission electron microscope equipped with a thermionic electron source with a Lab6 filament and acceleration voltages that can vary between 80-200 kV. It has the FEI super-twin (S-Twin) pole piece with a pole piece gap of 5.2 mm (Cs about 1.35 mm). This gives the microscope a resolution @ 200 kV of 1.4 Å in TEM mode. Other tecniques available on the microscope are scanning transmission electron microscopy (STEM, resolution 10 Å) with a high-angle annular dark-field detector (HAADF). Additionally, it is equipped with retractable cryo plates, which makes it ideal for cryo experiments.<br /> | ||
On the analytical side, the microscope is equipped with an Oxford X-Max 80T SDD X-ray detector for Energy Dispersive X-ray (EDS) spectroscopy and a Gatan Tridiem 863 imaging filter allowing for electron energy-loss spectroscopy (EELS) and energy-filtered imaging. For imaging, the microscope is equipped with TVIPS XF416 | On the analytical side, the microscope is equipped with an Oxford X-Max 80T SDD X-ray detector for Energy Dispersive X-ray (EDS) spectroscopy and a Gatan Tridiem 863 imaging filter allowing for electron energy-loss spectroscopy (EELS) and energy-filtered imaging (EF-TEM). For imaging, the microscope is equipped with TVIPS XF416 CMOS (4096x4096 px) before the the energy filter and a GATAN Ultrascan US1000 (2048x2048 px) after the energy filter.<br /> | ||
<!-- | |||
== TEM Schematic == | == TEM Schematic == | ||
A general schematic of a transmission electron microscope can be found [[/Schematic|here]] | A general schematic of a transmission electron microscope can be found [[/Schematic|here]] | ||
--> | |||
== Sample holders == | == Sample holders == | ||
| Line 19: | Line 27: | ||
The default specimen holder for the T20 is called Single-Tilt (FEI ST) and it is always present in building 314 Prep Room1. | The default specimen holder for the T20 is called Single-Tilt (FEI ST) and it is always present in building 314 Prep Room1. | ||
[[File:ST holder.jpg|300px]]<br /> | [[File:ST holder.jpg|300px]]<br /> | ||
The lab has also other specimen holders used for various application e.g. heating (furnace and MEMS-based), cooling, biasing and tomography. For information on the various specimen holders see [[LabAdviser/ | The lab has also other specimen holders used for various application e.g. heating (furnace and MEMS-based), cooling, biasing and tomography. For information on the various specimen holders see [[LabAdviser/314/Microscopy 314-307/TEM/Sample Holders|HERE]] | ||
== Who may operate the Tecnai T20 == | == Who may operate the Tecnai T20 == | ||
Anybody in need of a TEM microscope is welcome to apply for access to our facility by submitting an [ | Anybody in need of a TEM microscope is welcome to apply for access to our facility by submitting an [https://www.nanolab.dtu.dk/use-nanolab/use-of-our-facilities Access Request Form ].Shortly after your ARF has been received you will be contact by the microscopy support team in order to set up a meeting to further discuss your application.<br /> | ||
In order to be authorised to use the Tecnai T20 you must | In order to be authorised to use the Tecnai T20 you must complete the Tecnai training with consists of a theoretical lecture and 3 practical sessions of 4 hours each.<br /> | ||
Due to the similarity of the basic operations on a Tecnai TEM and a Titan TEM, a Tecnai trained user can receive additional training and progress in using a Titan TEM.<br /> | Due to the similarity of the basic operations on a Tecnai TEM and a Titan TEM, a Tecnai trained user can receive additional training and progress in using a Titan TEM.<br /> | ||
| Line 33: | Line 41: | ||
Booking on the T20 is done by the users in accordance to the booking rules. Booking rules can be found in LabManager under "Documents" for the T20. | Booking on the T20 is done by the users in accordance to the booking rules. Booking rules can be found in LabManager under "Documents" for the T20. | ||
'''Further information | '''Further information''' | ||
[http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=348 TEM Tecnai T20 in LabManager] | [http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=348 TEM Tecnai T20 in LabManager] | ||
| Line 53: | Line 62: | ||
*[[/STEM|Scanning Transmission Electron Microscopy]] | *[[/STEM|Scanning Transmission Electron Microscopy]] | ||
*[[/DF|Diffraction]] | *[[/DF|Diffraction]] | ||
*[[LabAdviser/314/Technique/ | *[[LabAdviser/314/Microscopy 314-307/Technique/X-ray_spectroscopy|EDS/WDS]] | ||
*[[LabAdviser/314/Technique/EELS|EELS]] | *[[LabAdviser/314/Microscopy 314-307/Technique/EELS|EELS]] | ||
*[[LabAdviser/314/Technique/EFTEM|EFTEM]] | *[[LabAdviser/314/Microscopy 314-307/Technique/EFTEM|EFTEM]] | ||
<!-- | |||
--> | |||
= Tips and Tricks = | = Tips and Tricks = | ||
| Line 62: | Line 73: | ||
Here you can find some help to solve small issues on the microscope. Let us know, if you have other suggestions. | Here you can find some help to solve small issues on the microscope. Let us know, if you have other suggestions. | ||
*[[LabAdviser/314/Microscopy 314-307/TEM/Tips/MagicSwitch|Magic Switch is not working properly]] | |||
*[[LabAdviser/314/Microscopy 314-307/TEM/Tips/TVIPS camera|TVIPS camera]] | |||
*[[LabAdviser/314/Microscopy 314-307/TEM/Tips/Aztec|Aztec connection problems]] | |||
*[[LabAdviser/314/Microscopy 314-307/TEM/Tips/GIF-apertures|GIF apertures are not responding]] | |||
*[[LabAdviser/314/Microscopy 314-307/TEM/Tips/HAADF-detector|HAADF detector doesn't give a signal]] | |||
*[[LabAdviser/314/Microscopy 314-307/TEM/Tips/No-STEM|No buttons for STEM acquisition]] | |||
<!-- | |||
--> | |||
= Reference material = | = Reference material = | ||
| Line 73: | Line 90: | ||
David B. Williams, C. Barry Carter, Transmission Electron Microscopy - A Textbook for Materials Science (Springer, 2009). | David B. Williams, C. Barry Carter, Transmission Electron Microscopy - A Textbook for Materials Science (Springer, 2009). | ||
'''Online Material:''' | '''Online Material:''' | ||
| Line 82: | Line 100: | ||
[http://www.ammrf.org.au/myscope/tem/introduction/ TEM Introduction by ammrf] | [http://www.ammrf.org.au/myscope/tem/introduction/ TEM Introduction by ammrf] | ||