LabAdviser/314/Preparation 314-307/Solid-matter/FIB-lamella: Difference between revisions
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'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/Preparation_314-307/Solid-matter/FIB-lamella click here]''' | |||
(''content by Anton Bay Andersen @DTU Nanolab, March 2020'') | |||
[[Category:314]] | [[Category:314]] | ||
[[Category:314-Preparation]] | [[Category:314-Preparation]] | ||
'''FIB lamella preparation''' | <!-- '''FIB lamella preparation''' --> | ||
=FIB lamella preparation= | =FIB lamella preparation= | ||
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Note: Milling like described above makes a wedge shaped sample. This increases mechanical stability while still making an extremely thin sample at the surface. If a flat sample is desired you can compensate by tilting the sample. The amount of tilt depends on material, acceleration voltage and current, so a bit of experimenting is required. | Note: Milling like described above makes a wedge shaped sample. This increases mechanical stability while still making an extremely thin sample at the surface. If a flat sample is desired you can compensate by tilting the sample. The amount of tilt depends on material, acceleration voltage and current, so a bit of experimenting is required. | ||