LabAdviser/314/Microscopy 314-307/SEM/AFEG: Difference between revisions
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'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/Microscopy_314-307/SEM/AFEG click here]''' | |||
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[[index.php?title=Category:314]] | |||
[[index.php?title=Category:314-Microscopy]] | |||
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=AFEG 250 Analytical ESEM (FEI Quanta FEG 250) = | =AFEG 250 Analytical ESEM (FEI Quanta FEG 250) = | ||
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* High vacuum (10<sup>-4</sup> Pa), Low vacuum (10 to 200Pa) | * High vacuum (10<sup>-4</sup> Pa), Low vacuum (10 to 200Pa) | ||
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!style="background:silver; color:black" align="center" valign="center" rowspan="3"| | !style="background:silver; color:black" align="center" valign="center" rowspan="3"|Samples | ||
|style="background:LightGrey; color:black"|Sample sizes | |style="background:LightGrey; color:black"|Sample sizes | ||
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