LabAdviser/314/Microscopy 314-307/SEM/AFEG: Difference between revisions

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VisualWikitext

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+'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/Microscopy_314-307/SEM/AFEG click here]'''
+''This section is written by DTU Nanolab internal if nothing else is stated.''
+[[index.php?title=Category:314]]
+[[index.php?title=Category:314-Microscopy]]
+__FORCETOC__
 =AFEG 250 Analytical ESEM (FEI Quanta FEG 250) =
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 *'''Electron source'''
-Field emission gun
+**Field emission gun
 *'''Accelerating voltage'''
-V- 30 kV
+**500 V- 30 kV
 *'''Resolution'''
-nm at 30 kV (SE)
+**2 nm at 30 kV (SE)
 *'''Imaging detectors'''
-Everhart-Thornley (SE/BSE), Solid State BSE, Large Field, Gaseous SE, Gaseous BSE, Gaseous Analytical, STEM, vCD and CCD Camera
+**Everhart-Thornley (SE/BSE)
+**Solid State BSE
+**Large Field (LVD)
+**Gaseous SE (GSED)
+**Gaseous BSE
+**Gaseous Analytical (GAD)
+**STEM
+**vCD
 *'''Imaging modes'''
 High and low vacuum
 *'''Analytical capabilities'''
-Energy dispersive X-rays (Oxford Instruments 50 mm2 X-Max silicon drift detector, MnKα resolution at 124 eV)
+**Energy dispersive X-rays (Oxford Instruments 50 mm2 X-Max silicon drift detector, MnKα resolution at 124 eV)
-Wavelength Dispersive Spectrosopy
+**Wavelength Dispersive Spectrosopy
 ==Equipment performance and process related parameters==
 {| border="2" cellspacing="0" cellpadding="0"
 !colspan="2" border="none" style="background:silver; color:black;" align="center |Equipment
-|style="background:WhiteSmoke; color:black" align="center"|FEI QFEG 200 Cryo ESEM
+|style="background:WhiteSmoke; color:black" align="center"|AFEG FEI Quanta FEG 250
 |-
 !style="background:silver; color:black;" align="center" width="60"| Purpose
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 * 2 nm at 30 keV for Au on C sample with the ETD detector
 |-
-!style="background:silver; color:black" align="center" valign="center" rowspan="7"|Instrument specifics
+!style="background:silver; color:black" align="center" valign="center" rowspan="6"|Instrument specifics
 |style="background:LightGrey; color:black"|Detectors
 |style="background:WhiteSmoke; color:black"|
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 |style="background:LightGrey; color:black"|EDS
 |style="background:WhiteSmoke; color:black"|
-* Oxford Instruments 80 mm<sup>2</sup> X-Max silicon drift detector, MnKα resolution at 124 eV
+* Oxford Instruments 50 mm<sup>2</sup> X-Max silicon drift detector, MnKα resolution at 124 eV
 |-
 |style="background:LightGrey; color:black"|Operating pressures
@@ Line 76: / Line 89: @@
 * High vacuum (10<sup>-4</sup> Pa), Low vacuum (10 to 200Pa)
 |-
-!style="background:silver; color:black" align="center" valign="center" rowspan="3"|Substrates
+!style="background:silver; color:black" align="center" valign="center" rowspan="3"|Samples
 |style="background:LightGrey; color:black"|Sample sizes
 |style="background:WhiteSmoke; color:black"|
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 | style="background:LightGrey; color:black"|Allowed materials
 |style="background:WhiteSmoke; color:black"|
-* Conductors, Semiconductors,Insulators, Prepared Biological
+* Conductors, Semiconductors,Insulators, Prepared Biological ((not pathogents!)
 |-
 |}
-'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php?title=LabAdviser/314/SEM/QFEG click here]'''
-'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/SEM/AFEG click here]'''