Specific Process Knowledge/Etch/DRIE-Pegasus/processC: Difference between revisions
Appearance
No edit summary |
|||
| (3 intermediate revisions by the same user not shown) | |||
| Line 2: | Line 2: | ||
<!--Checked for updates on 14/5-2018 - ok/jmli --> | <!--Checked for updates on 14/5-2018 - ok/jmli --> | ||
== Process C == | == Process C == | ||
{{contentbydryetch}} | |||
<!--Checked for updates on 2/02-2023 - ok/jmli --> | |||
<!--Checked for updates on 4/9-2025 - ok/jmli --> | |||
Process C is | Process C is intended to be used on features in the sub 2-3 µm range. The recipe was run on a 100 mm Nanolab wafer with a test pattern of a series of lines and dots with sizes ranging from 30 nm to 300 nm. The etch load was extremely high, approaching 100 %. | ||
The 100 mm wafers had an Al mask made by lift-off: | The 100 mm wafers had an Al mask made by lift-off: | ||