Specific Process Knowledge/Characterization/XPS/Processing/Basics: Difference between revisions
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'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php?title=Specific_Process_Knowledge/Characterization/XPS/Processing/Basics click here]''' | |||
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= XPS data processing guide = | = XPS data processing guide = | ||
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In case you want to follow along with your own analysis, you can download the data from [[Media:20150518_ZnO_CuZn_ZnO.doc| here (this file is a .zip file that has been renamed to .doc in order to be uploaded to LabAdviser, so download and rename to .zip and extract the files)]] | In case you want to follow along with your own analysis, you can download the data from [[Media:20150518_ZnO_CuZn_ZnO.doc| here (this file is a .zip file that has been renamed to .doc in order to be uploaded to LabAdviser, so download and rename to .zip and extract the files)]] | ||
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro|Open data | # [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro|Survey spectra analysis]] | ||
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres|Open | ## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro#Open_data_and_save_the_processing_document|Open data]] | ||
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro#Spectrum_views|Spectrum views]] | |||
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro#Views_of_data_with_several_etch_levels|View of data with several levels]] | |||
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro#Zooming|Zooming]] | |||
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro#Automatic_peak_identification_of_survey_spectra|Automatic peak ID]] | |||
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro#Manually_add_peaks_to_identification_of_survey_spectra|Manual ID]] | |||
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro#Make_a_depth_profile_from_survey_spectrum|Depth profile]] | |||
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres|High resolution spectra analysis]] | |||
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres#Selecting_high_resolution_spectra_for_peak_fitting|Open spectra]] | |||
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres#Peak_fitting|Peak fitting]] | |||
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres#Verify_correctness_of_fitting_routine|Ensure correct fitting parameters]] | |||
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres#Change_fitting_constraints|Apply constraints]] | |||
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/3fitting|Complete the analysis]] | # [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/3fitting|Complete the analysis]] | ||