LabAdviser/314/Microscopy 314-307/TEM/T20/STEM: Difference between revisions
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'''Scanning TEM:''' <br | <span style="background:#FF2800">THIS PAGE IS UNDER CONSTRUCTION</span>[[image:Under_construction.png|200px]] | ||
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[[Category:314-Microscopy]] | |||
'''Scanning TEM:''' </br> | |||
By using STEM and a high angle annular dark field detector (HAADF), it is possible to form images where the contrast is directly related to the atomic number (z-contrast image). | By using STEM and a high angle annular dark field detector (HAADF), it is possible to form images where the contrast is directly related to the atomic number (z-contrast image). | ||
Latest revision as of 13:42, 9 August 2025
THIS PAGE IS UNDER CONSTRUCTION
Scanning TEM:
By using STEM and a high angle annular dark field detector (HAADF), it is possible to form images where the contrast is directly related to the atomic number (z-contrast image).