Specific Process Knowledge/Characterization/Dektak 3ST: Difference between revisions
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'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/Dektak_3ST click here]''' | '''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/Dektak_3ST click here]''' | ||
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[[Category:Equipment|Characterization Profiler]] | [[Category:Equipment|Characterization Profiler]] | ||
[[Category:Characterization|Profiler]] | [[Category:Characterization|Profiler]] | ||
= Dektak 3ST (Stylus Profiler)= | = Dektak 3ST (Stylus Profiler) aka "III-V Profiler"= | ||
[[image:III-V profiler.JPG|300x300px|right|thumb|The profiler placed in 346-904 (Dektak 3ST).]] | [[image:III-V profiler.JPG|300x300px|right|thumb|The profiler placed in 346-904 (Dektak 3ST).]] | ||