Specific Process Knowledge/Etch/Etching of Silicon Nitride: Difference between revisions
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== Comparing silicon nitride etch methods at | == Comparing silicon nitride etch methods at DTU Nanolab == | ||
There are a broad | There are a broad variety of silicon nitride etch methods at DTU Nanolab. The methods are compared here to make it easier for you to compare and choose the one that suits your needs. | ||
*[[Specific Process Knowledge/Etch/Wet Silicon Nitride Etch|Wet Silicon Nitride Etch]] | *[[Specific Process Knowledge/Etch/Wet Silicon Nitride Etch|Wet Silicon Nitride Etch]] | ||
*[[Specific Process Knowledge/Etch/AOE (Advanced Oxide Etch)/Silicon Nitride Etch using AOE|Etch of Silicon Nitride using AOE]] | *[[Specific Process Knowledge/Etch/AOE (Advanced Oxide Etch)/Silicon Nitride Etch using AOE|Etch of Silicon Nitride using AOE]] | ||
*[[Specific_Process_Knowledge/Etch/Etching_of_Silicon_Oxide/SiO2_etch_using_ASE|Nitride etch using ASE]] | |||
*[[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE/Ion Beam Etching using IBSD Ionfab 300]] | *[[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE/Ion Beam Etching using IBSD Ionfab 300]] | ||
*[[Specific_Process_Knowledge/Etch/ICP_Metal_Etcher/silicon_nitride|Silicon nitride etch using the ICP metal]] | *[[Specific_Process_Knowledge/Etch/ICP_Metal_Etcher/silicon_nitride|Silicon nitride etch using the ICP metal]] | ||
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![[Specific Process Knowledge/Etch/Wet Silicon Nitride Etch|Wet Silicon Nitride Etch]] | ![[Specific Process Knowledge/Etch/Wet Silicon Nitride Etch|Wet Silicon Nitride Etch]] | ||
![[Specific Process Knowledge/Etch/Wet Silicon Oxide Etch (BHF)|BHF]] | ![[Specific Process Knowledge/Etch/Wet Silicon Oxide Etch (BHF)|BHF]] | ||
![[ | ![[Specific_Process_Knowledge/Etch/DRIE-Pegasus/Pegasus-4|Pegasus 4]] | ||
![[Specific Process Knowledge/Etch/AOE (Advanced Oxide Etch)|AOE (Advanced Oxide Etch)]] | ![[Specific Process Knowledge/Etch/AOE (Advanced Oxide Etch)|AOE (Advanced Oxide Etch)]] | ||
![[Specific Process Knowledge/Etch/ASE_(Advanced_Silicon_Etch)|ASE]] | |||
![[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE/IBSD Ionfab 300]] | ![[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE/IBSD Ionfab 300]] | ||
![[Specific Process Knowledge/Etch/ICP Metal Etcher|ICP Metal]] | ![[Specific Process Knowledge/Etch/ICP Metal Etcher|ICP Metal]] | ||
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*Isotropic etch | *Isotropic etch | ||
*Well suited for removing all PECVD nitride on a wafer surface (nitride strip) without a mask. Etches LPCVD nitride very slowly | *Well suited for removing all PECVD nitride on a wafer surface (nitride strip) without a mask. Etches LPCVD nitride very slowly | ||
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* Anisotropic etch: vertical sidewalls | |||
* With cassette loader for batch processing. | |||
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*Anisotropic etch: vertical sidewalls | *Anisotropic etch: vertical sidewalls | ||
*Deep etch | |||
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*Anisotropic etch: vertical sidewalls | *Anisotropic etch: vertical sidewalls | ||
* | *Primarily for samples with small amounts of metal | ||
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*Primarily for pure physical etch by sputtering with Ar-ions | *Primarily for pure physical etch by sputtering with Ar-ions | ||
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*Anisotropic etch: vertical sidewalls | *Anisotropic etch: vertical sidewalls | ||
*Primarily for Cl/Br etch chemistry. | |||
*F-chemistry, please use AOE or Pegasus 4. | |||
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*Silicon Nitride | *Silicon Nitride | ||
*Aluminium | *Aluminium | ||
* | *Chromium (if needed) | ||
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*Photoresist | |||
*DUV resist | |||
*E-beam resist | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Aluminium | |||
*Chromium (if needed) | |||
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*Photoresist | *Photoresist | ||
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*Silicon Nitride | *Silicon Nitride | ||
*Aluminium | *Aluminium | ||
* | *Metals if they cover less than 5% of the wafer area | ||
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*Any material that is accepted in the machine | *Any material that is accepted in the machine | ||
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!Etch rate range | !Etch rate range | ||
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*Si<sub>3</sub>N<sub>4</sub> @ 160 <sup>o</sup>C: ~ | *Si<sub>3</sub>N<sub>4</sub> @ 160 <sup>o</sup>C: ~26 Å/min | ||
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*PECVD nitride: ~40.0-100.0 nm/min | |||
*Stoichiometric LPCVD nitride: ~0.65-8 nm/min <!-- Copyrigth issues kabi (''Yannick Seis, KU, 2019'')--> | |||
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* | *Process dependent. | ||
*From 0 to ~300 nm/min | |||
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* | *Process dependent. | ||
*from 0 to ~500 nm/min | |||
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* | *Probably between 20-300 nm/min depending on the process parameters | ||
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*Process dependent. | *Process dependent. | ||
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!Substrate size | !Substrate size | ||
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*<nowiki>#</nowiki>1-25 | *<nowiki>#</nowiki>1-25 4" and 6" wafers | ||
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*<nowiki>#</nowiki>1-25 | *<nowiki>#</nowiki>1-25 4"-6" wafers | ||
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*As many small samples as can be | *As many small samples as can be bonded on a 150mm wafer | ||
*<nowiki>#</nowiki>1 | *50 mm wafers if bonded on a 150mm wafer | ||
* | *<nowiki>#</nowiki>1 100 mm wafer if bonded on a 150 mm wafer | ||
*#1 150 mm wafer | |||
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*As many small samples as can be fitted on a 100mm wafer | *As many small samples as can be fitted on a 100mm wafer | ||
*<nowiki>#</nowiki>1 50 mm wafer fitted on a 100mm wafer | *<nowiki>#</nowiki>1 50 mm wafer fitted on a 100mm wafer | ||
*<nowiki>#</nowiki>1 100 mm wafer | *<nowiki>#</nowiki>1 100 mm wafer | ||
*<nowiki>#</nowiki>1 | | | ||
*As many small samples as can be fitted on the 100mm carrier (bad/no cooling!) | |||
*<nowiki>#</nowiki>1 100mm wafer (or smaller with carrier) | |||
*<nowiki>#</nowiki>1 150mm wafer (only when the system is set up for 150mm) | |||
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*As many samples as can be securely fitted on a up to 200mm wafer | *As many samples as can be securely fitted on a up to 200mm wafer | ||
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*E-beam resists | *E-beam resists | ||
*DUV resists | *DUV resists | ||
* | *Aluminium (only for masking | ||
*Chromium (only for masking and on the back side if fused silica) | |||
*Quartz/fused silica | *Quartz/fused silica | ||
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*DUV resists | *DUV resists | ||
*Aluminium | *Aluminium | ||
*Chromium ( | *Chromium (only for masking and on the back side if fused silica) | ||
*Quartz/fused silica | |||
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*Silicon | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Silicon Oxynitride | |||
*Photoresist | |||
*E-beam resists | |||
*DUV resists | |||
*Other metals if they cover less than 5% of the wafer area | |||
*Quartz/fused silica | *Quartz/fused silica | ||
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Latest revision as of 08:46, 26 March 2025
Unless anything else is stated, everything on this page, text and pictures are made by DTU Nanolab.
All links to Kemibrug (SDS) and Labmanager Including APV and QC requires login.
Feedback to this page: click here
Comparing silicon nitride etch methods at DTU Nanolab
There are a broad variety of silicon nitride etch methods at DTU Nanolab. The methods are compared here to make it easier for you to compare and choose the one that suits your needs.
- Wet Silicon Nitride Etch
- Etch of Silicon Nitride using AOE
- Nitride etch using ASE
- IBE/Ion Beam Etching using IBSD Ionfab 300
Compare the methods for Silicon Nitride etching
| Wet Silicon Nitride Etch | BHF | Pegasus 4 | AOE (Advanced Oxide Etch) | ASE | IBE/IBSD Ionfab 300 | ICP Metal
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| Generel description |
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| Possible masking materials |
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| Etch rate range |
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| Substrate size |
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| Allowed materials |
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