LabAdviser/314/Preparation 314-307/Solid-matter: Difference between revisions

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= Ion Milling =
= Ion Milling =
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== Fischione Low Angle Ion Milling and Polishing System Model 1010 ==
== Fischione Low Angle Ion Milling and Polishing System Model 1010 ==


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== Fischione NanoMill model 1040 ==
== Fischione NanoMill model 1040 ==



Latest revision as of 10:21, 19 November 2024

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This section is written by DTU Nanolab internal if nothing else is stated.


Mechanical preparation equipment is available for experience users, who know how to use the equipment. Access to the preparation lab is needed. We do not provide training on the equipment.


Cutting

Struers Minitom

Brochure

Location Building 307, Prep Lab 109



Well Precision Diamond Wire Saw

Brochure

Location Building 307, Prep Lab 109



Ultrasonic cutter

Manual - requires login

Location Building 307, Prep Lab 109

.


Grinding/Polishing

TechPrep Allied

The MultiPrep™ System enables precise semiautomatic sample preparation of a wide range of materials for microscopic (optical, SEM, FIB, TEM, AFM, etc.) evaluation.

Capabilities include parallel polishing, angle polishing, site-specific polishing or any combination thereof. It provides reproducible results by eliminating inconsistencies between users, regardless of their skill.

Brochure

Location Building 307, Prep Lab 109



Dimple Grinder

Manual - requires login

Location Building 307, Prep Lab 109

.


Ion Milling

Fischione NanoMill model 1040

This TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens.

Brochure

Location Building 314, Common Area


Missing equipment

Mini grinder/polisher

Sample preparation processes

Here we collected a few sample preparation processes done at DTU Nanolab building 314/307: