LabAdviser/314/Preparation 314-307/Solid-matter: Difference between revisions
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'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/Preparation_314-307/Solid-matter click here]''' | '''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/Preparation_314-307/Solid-matter click here]''' | ||
''This section is written by DTU Nanolab internal if nothing else is stated.'' | |||
[[Category:314]] | [[Category:314]] | ||
[[Category:314-Preparation]] | [[Category:314-Preparation]] | ||
Mechanical preparation equipment is available for experience users, who know how to use the equipment. Access to the preparation lab is needed. We do not provide training on the equipment. | |||
= Cutting = | = Cutting = | ||
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[[File:IMG_3665.JPG|200px|left|thumb|Location Building 307, Prep Lab 109]]<br /> | [[File:IMG_3665.JPG|200px|left|thumb|Location Building 307, Prep Lab 109]]<br /> | ||
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== Ultrasonic cutter == | |||
[https://labmanager.dtu.dk/view_binary.php?class=MiscDocument&id=15&name=Manual+-+ULTRASONIC+DISK+CUTTER+MODEL+170.pdf Manual] ''- requires login'' | |||
[[File:Ultrasonic_Cutter.jpg|200px|left|thumb|Location Building 307, Prep Lab 109]].<br /> | |||
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= Grinding/Polishing = | = Grinding/Polishing = | ||
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== Struers Labopol -25 == | == Struers Labopol -25 == | ||
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== TechPrep Allied == | == TechPrep Allied == | ||
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== Struers Labopol -5 == | == Struers Labopol -5 == | ||
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[[File:Labopol4.png|200px|left|thumb|Location Building 307, Prep Lab 109]]<br /> | [[File:Labopol4.png|200px|left|thumb|Location Building 307, Prep Lab 109]]<br /> | ||
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== Dimple Grinder == | |||
[https://labmanager.dtu.dk/view_binary.php?class=MiscDocument&id=15&name=Manual+-+DIMPLING+GRINDER+MODEL+200.pdf Manual] ''- requires login'' | |||
[[File:Dimple_Grinder.jpg|200px|left|thumb|Location Building 307, Prep Lab 109]].<br /> | |||
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= Ion Milling = | = Ion Milling = | ||
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== Fischione Low Angle Ion Milling and Polishing System Model 1010 == | == Fischione Low Angle Ion Milling and Polishing System Model 1010 == | ||
The Fischione Ion Mill is used for producing TEM specimens with large electron transparent areas. Samples are pre-thinned by e.g. mechanical grinding and polishing or chemical polishing. The milling or polishing is performed by argon ions. The instrument has two independently adjustable Hollow Anode Discharge (HAD) argon ion sources, which can be operated from 0.5 to 6.0 kV with currents from 3 mA to 8 mA. The milling angle can be adjusted in the range of 0° to 45°. Tuning the milling parameters allows for coarse or gentle milling and the goal is to get clean samples free of physical or chemical artifacts | The Fischione Ion Mill is used for producing TEM specimens with large electron transparent areas. Samples are pre-thinned by e.g. mechanical grinding and polishing or chemical polishing. The milling or polishing is performed by argon ions. The instrument has two independently adjustable Hollow Anode Discharge (HAD) argon ion sources, which can be operated from 0.5 to 6.0 kV with currents from 3 mA to 8 mA. The milling angle can be adjusted in the range of 0° to 45°. Tuning the milling parameters allows for coarse or gentle milling and the goal is to get clean samples free of physical or chemical artifacts | ||
[ | [https://labmanager.dtu.dk/view_binary.php?class=MiscDocument&id=15&name=Operation_Manual_Fischione_1010.pdf Manual] ''- requires login'' | ||
[[File:IMG_3674.JPG|300px|left|thumb|Location Building 307, Prep Lab 109]].<br /> | [[File:IMG_3674.JPG|300px|left|thumb|Location Building 307, Prep Lab 109]].<br /> | ||
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== Fischione NanoMill model 1040 == | == Fischione NanoMill model 1040 == | ||
This TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens. | This TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens. | ||
[http://www.fischione.com/products/ion-beam-preparation/model-1040-nanomill%C2%AE-tem-specimen-preparation-system | [http://www.fischione.com/products/ion-beam-preparation/model-1040-nanomill%C2%AE-tem-specimen-preparation-system Brochure] | ||
[[File:IMG_3679.JPG|250px|left|thumb|Location Building 314, Common Area]] | [[File:IMG_3679.JPG|250px|left|thumb|Location Building 314, Common Area]] | ||
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= Missing equipment = | |||
== Mini grinder/polisher == | == Mini grinder/polisher == | ||
= Sample preparation processes = | = Sample preparation processes = | ||
Latest revision as of 10:21, 19 November 2024
Feedback to this page: click here
This section is written by DTU Nanolab internal if nothing else is stated.
Mechanical preparation equipment is available for experience users, who know how to use the equipment. Access to the preparation lab is needed. We do not provide training on the equipment.
Cutting
Struers Minitom
Well Precision Diamond Wire Saw
Ultrasonic cutter
Manual - requires login
.
Grinding/Polishing
TechPrep Allied
The MultiPrep™ System enables precise semiautomatic sample preparation of a wide range of materials for microscopic (optical, SEM, FIB, TEM, AFM, etc.) evaluation.
Capabilities include parallel polishing, angle polishing, site-specific polishing or any combination thereof. It provides reproducible results by eliminating inconsistencies between users, regardless of their skill.
Dimple Grinder
Manual - requires login
.
Ion Milling
Fischione NanoMill model 1040
This TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens.
Missing equipment
Mini grinder/polisher
Sample preparation processes
Here we collected a few sample preparation processes done at DTU Nanolab building 314/307: