Specific Process Knowledge/Thin film deposition/Deposition of Silicon: Difference between revisions
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'''Feedback to this page''': '''[mailto:labadviser@ | '''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php?title=Specific_Process_Knowledge/Thin_film_deposition/Deposition_of_Silicon&action=edit click here]''' | ||
<i> Unless otherwise stated, this page is written by <b>DTU Nanolab internal</b></i> | |||
PolySilicon can be sputtered | PolySilicon can be deposited in several Nanolab tools. It can be sputtered, e-beam evaporated or be deposited in the PolySilicon furnaces. In the chart below you can compare the different deposition methods: | ||
==Deposition of PolySilicon using LPCVD== | |||
DTU Nanolab has two furnaces for deposition of LPCVD (Low Chemical Vapour Deposition) polysilicon: A 6" furnace (installed in 2011) for deposition of standard polySi, amorphous polySi and boron doped polySi on 100 mm or 150 mm wafers and a 4" furnace (installed in 1995) for deposition of standard polySi, amorphous polySi, boron- and phosphorous doped polySi on 100 mm wafers. In LabManager the two furnaces are named "Furnace: LPCVD Poly-Si (4") (B4)" and "Furnace: LPCVD Poly-Si (6") (E2)", respectively. | |||
*[[Specific_Process_Knowledge/Thin_film_deposition/Deposition_of_polysilicon/Deposition_of_polysilicon_using_LPCVD/Standard_recipes,_QC_limits_and_results_for_the_4%22_polysilicon_furnace|Deposition of polysilicon using the 4" polysilicon furnace]] | |||
*[[Specific_Process_Knowledge/Thin_film_deposition/Deposition_of_polysilicon/Deposition_of_polysilicon_using_LPCVD/Standard_recipes,_QC_limits_and_results_for_the_6%22_polysilicon_furnace|Deposition of polysilicon using the 6" polysilicon furnace]] | |||
==Deposition of Silicon using PECVD== | |||
At Nanolab you can also deposit silicon the using PECVD. The deposition temperature is 300 °C. | |||
* [[/Si deposition using PECVD|Si deposition using PECVD3]] | |||
==Deposition of Silicon using sputter deposition== | |||
At Nanolab we can sputter silicon the using Wordentec or the Lesker Sputter systems. One of the advantages of sputtering is that you can deposit on almost any material you like. | |||
* [[Specific Process Knowledge/Thin film deposition/Si sputter in Wordentec|Si sputter deposition in the Wordentec]] | |||
* [[Specific Process Knowledge/Thin film deposition/Deposition of Silicon/Si sputter in Sputter-System Lesker|Si sputter deposition in the Sputter-System (Lesker)]] - ''includes information on surface roughness and stress'' | |||
* [[Specific Process Knowledge/Thin film deposition/Deposition of Silicon/Si sputter in Sputter-System Metal-Oxide(PC1)|Si sputter deposition in the Sputter-System Metal-Oxide(PC1)]] | |||
* [[Specific Process Knowledge/Thin film deposition/Deposition of Silicon/Si sputter in Sputter-System Metal-Oxide(PC3)|Si sputter deposition in the Sputter-System Metal-Oxide(PC3)]] | |||
It was previosly possible to sputter Si with our [[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300| IonFab 300]]. You can read about the deposition conditions and results from that [[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300/IBSD of Si|here]]. | |||
==Deposition of Silicon using e-beam evaporation== | |||
It is possible to e-beam evaporate silicon at Nanolab using the [[Specific Process Knowledge/Thin film deposition/10-pocket e-beam evaporator|E-beam evaporator (10-pockets)]]. As with sputtering you can deposit on almost any material. In e-beam evaporation the deposition is line-of-sight and will be suitable for lift-off. However for 8" wafers the system is not optimized for lift-off on the full diameter of the wafer. | |||
* [[Specific Process Knowledge/Thin film deposition/Deposition of Silicon/Si evaporation in E-beam evaporator Temescal-2|Si evaporation in E-beam evaporator (10-pockets)]] | |||
==Comparison of the methods for deposition of Silicon== | |||
{| border="1" cellspacing="0" cellpadding="3" | {| border="1" cellspacing="0" cellpadding="3" | ||
|-style="background:silver; color:black" | |-style="background:silver; color:black" | ||
! | ! | ||
! | ! 4" and 6" Furnace PolySi ([[Specific Process Knowledge/Thin film deposition/Furnace LPCVD PolySilicon|Furnace LPCVD PolySi]]) | ||
! | ! PECVD ([[Specific Process Knowledge/Thin film deposition/PECVD|PECVD]]) | ||
! Sputter ([[Specific Process Knowledge/Thin film deposition/Wordentec|Wordentec]]) | ! Sputter ([[Specific Process Knowledge/Thin film deposition/Wordentec|Wordentec]]) | ||
! Sputter ([[Specific Process Knowledge/ | ! Sputter ([[Specific Process Knowledge/Thin film deposition/Lesker|Lesker]]) | ||
! | ! Sputter ([[Specific Process Knowledge/Thin film deposition/Cluster-based multi-chamber high vacuum sputtering deposition system|Sputter-system Metal-Oxide (PC1) and Sputter-system Metal-Nitride (PC3)]]) | ||
! E-beam evaporation ([[Specific Process Knowledge/Thin film deposition/10-pocket e-beam evaporator|E-beam evaporator (10-pockets)]]) | |||
|- | |- | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
! | ! General description | ||
| LPCVD (low pressure chemical vapour deposition) of a-Si and poly-Si | |||
| Plasma Enhanced Chemical Vapor Deposition of Si | |||
| Sputter deposition of Si. | |||
| Sputter deposition of Si. | |||
| Sputter deposition of Si. | |||
| E-beam evaporation of Si. | |||
|- | |- | ||
|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
! Doping facility | |||
|Yes, B (boron) and P (phosphorus) | |||
|Yes, B and P | |||
|None | |||
|None | |||
|None | |||
|None | |||
|- | |||
|-style="background:WhiteSmoke; color:black" | |||
! Pre-clean | ! Pre-clean | ||
| | |New wafers can go directly into the furnace. Processed wafers have to be RCA cleaned | ||
| | |||
|RF Ar clean | |RF Ar clean available | ||
| | |RF Ar clean available | ||
|RF Ar clean | |RF Ar clean available | ||
|None | |||
|- | |- | ||
|-style="background: | |-style="background:LightGrey; color:black" | ||
! Layer thickness | ! Layer thickness | ||
|~5 nm to 2 µm, if thicker layers are needed please ask the furnace team. | |||
|~ | |few nm to ~ 600 nm | ||
| | |few nm to ~ 300 nm | ||
| | |few nm to >200 nm | ||
| | |few nm to ? | ||
|few nm to 100 nm * | |||
|- | |- | ||
|-style="background: | |-style="background:WhiteSmoke; color:black" | ||
! Deposition rate | ! Deposition rate | ||
| | | | ||
*undoped, boron doped:~ | *undoped, boron doped:~100 Å/min | ||
* | *Phosphorous doped:~20 Å/min | ||
| | |~6 Å/s can probably be higher | ||
| | |||
| | On the order of 1 Å/s dependent on process parameters. See more [[Specific Process Knowledge/Thin film deposition/Si sputter in Wordentec|here.]] | ||
| | | Depends on process parameters, roughly 0.2-2 Å/s. See Process Log. | ||
|Depends on process parameters, at least 0.3 Å/s, see conditions [[Specific_Process_Knowledge/Thin_film_deposition/Cluster-based_multi-chamber_high_vacuum_sputtering_deposition_system#Standard_recipe_performance|here]] | |||
| 1 Å/s | |||
|- | |- | ||
|-style="background: | |-style="background:LightGrey; color:black" | ||
! Process temperature | ! Process temperature | ||
|560 °C (amorphous) and 620 °C (poly) | |||
|560 | |300 °C | ||
| | |room temperature | ||
| | |room temperature | ||
| | |room temperature to 600 °C | ||
|room temperature to 250 °C | |||
|- | |||
|-style="background:WhiteSmoke; color:black" | |||
|-style="background: | |||
! Step coverage | ! Step coverage | ||
|Good | |Good | ||
| | |Medium | ||
| | |Medium | ||
| | |Medium | ||
|Medium - may be possible to improve using HIPIMS | |||
|no step coverage unless using tilt holder, in which case the step coverage can be very good and can be tuned. | |||
|- | |- | ||
|-style="background: | |-style="background:LightGrey; color:black" | ||
! Adhesion | ! Adhesion | ||
|Good for fused silica, silicon oxide, silicon nitride, silicon | |Good for fused silica, silicon oxide, silicon nitride, silicon | ||
| | |Not tested, but do not deposit on top of silicon | ||
| | | | ||
| | | | ||
| | |||
| | |||
|- | |- | ||
|-style="background:WhiteSmoke; color:black" | |||
! Batch size | |||
| | |||
*1-30 wafers (4" furnace) | |||
*1-25 wafes (6" furnace) | |||
| | |||
* Several small samples | |||
* 1-2x 50 mm wafer | |||
* 1x 100 mm wafer | |||
* 1x 150 mm wafer | |||
| | |||
*24x 2" wafers or | |||
*6x 4" wafers or | |||
*6x 6" wafers | |||
| | |||
* Up to 1x6" wafers | |||
* smaller pieces | |||
| | |||
*Up to 10x6" or 4" wafers | |||
*many smaller pieces | |||
| | |||
*Up to 4 x 6" wafer or | |||
*3x 8" wafers (ask for special holder) | |||
*Many smaller pieces | |||
|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
! Allowed substrates | ! Allowed substrates | ||
| | | | ||
* Silicon wafers | * Silicon wafers (new or RCA cleaned) | ||
* Quartz wafers | ** with layers of silicon oxide or silicon (oxy)nitride | ||
* | ** from the A, B and E stack furnaces | ||
* Quartz/fused silica wafers (RCA cleaned) | |||
| | |||
*See the cross contamination sheets | |||
| | |||
*Almost any that does not degas. | |||
| | |||
* Almost any that does not degas, see cross-contamination sheet | |||
| | |||
*Almost any that does not degas, see cross-contamination sheets | |||
| | |||
*Almost any that does not degas, see cross-contamination sheets | |||
|- | |- | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
! Allowed material | ! Allowed material | ||
| *Only those above (under allowed substrates). | |||
| | | | ||
*See the cross contamination sheets | |||
| | |||
* Almost any that does not degas. | |||
| | |||
*Almost any that does not degas, see the cross-contamination sheet | |||
| | | | ||
*Almost any that does not degas, see the cross-contamination sheets | |||
| | | | ||
*Almost any that does not degas, see cross-contamination sheet | |||
* | |||
|- | |- | ||
|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
! Comment | ! Comment | ||
| | | | ||
| | |Only in PECVD3 | ||
| | | | ||
| | | | ||
| | | | ||
| | | Please only deposit Si on the afternoon before a scheduled service as it can result in many flakes in the chamber. See the booking calendar or ask staff to find out when the next service will be. | ||
|} | |} | ||
'''*''' If you wish to deposit a thicker layer than 100 nm please talk to responsible staff or write to thinfilm@nanolab.dtu.dk | |||