LabAdviser/314/Microscopy 314-307: Difference between revisions
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''This section is written by DTU Nanolab internal if nothing else is stated.'' | |||
[[Category:314]] | [[Category:314]] | ||
[[Category:314-Microscopy]] | [[Category:314-Microscopy]] | ||
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{| border="0" cellspacing="100" style="margin: auto;" | {| border="0" cellspacing="100" style="margin: auto;" | ||
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| align="center" width="200px" heigth="250px" | '''Transmission Electron Microscopy (TEM)''' [[image:Microscopy- | | align="center" width="200px" heigth="250px" | '''Transmission Electron Microscopy (TEM)''' [[image:Microscopy-icon_TEM.png|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/TEM|TEM ]] | ||
| align="center" width="200px" | '''Scanning Electron Microscopy (SEM)''' [[image:Microscopy- | | align="center" width="200px" | '''Scanning Electron Microscopy (SEM)''' [[image:Microscopy-icon_SEM.png|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/SEM|SEM ]] | ||
| align="center" width="200px" | '''Dual-beam Electron | | align="center" width="200px" | '''Dual-beam Electron Microscopy - FIB-SEM and PFIB-SEM''' [[image:Microscopy-icon_FIB.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/FIB|FIB ]] | ||
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Depending on the equipment, different techniques are available: | Depending on the equipment, different techniques are available: | ||
{| border="0" cellspacing="75" style="margin: auto;" | {| border="0" cellspacing="75" style="margin: auto;" | ||
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| align="center" width="200px" heigth="250px" | '''X-Ray spectroscopy (EDS/WDS)''' [[image:Microscopy- | | align="center" width="200px" heigth="250px" | '''X-Ray spectroscopy (EDS/WDS)''' [[image:Microscopy-icon_red.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy 314-307/Technique/X-ray_spectroscopy|EDS/WDS ]] | ||
| align="center" width="200px" | '''Electron Energy Loss Spectroscopy (EELS)''' [[image:Microscopy- | | align="center" width="200px" | '''Electron Energy Loss Spectroscopy (EELS)''' [[image:Microscopy-icon_red.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/Technique/EELS|EELS ]] | ||
| align="center" width="200px" | '''Energy Filtered TEM (EFTEM)''' [[image:Microscopy- | | align="center" width="200px" | '''Energy Filtered TEM (EFTEM)''' [[image:Microscopy-icon_red.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy 314-307/Technique/EFTEM|EFTEM ]] | ||
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<!-- | align="center" width="200px" | '''Electron Backscatter Diffraction and Transmission Kikuchi Diffraction (EBSD/TKD)''' [[image:Microscopy- | <!-- | align="center" width="200px" | '''Electron Backscatter Diffraction and Transmission Kikuchi Diffraction (EBSD/TKD)''' [[image:Microscopy-icon_red.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/Technique/EBSD-TKD|EBSD/TKD ]] --> | ||
| align="center" width="200px" | '''Electron Backscatter Diffraction and Transmission Kikuchi Diffraction (EBSD/TKD)''' [[image:Microscopy- | | align="center" width="200px" | '''Electron Backscatter Diffraction and Transmission Kikuchi Diffraction (EBSD/TKD)''' [[image:Microscopy-icon_red.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/SEM/Nova/Transmission Kikuchi diffraction|EBSD/TKD ]] | ||
|EBSD/TKD ]] | |||
| align="center" width="200px" | '''Electron Holography''' [[image:Microscopy- | | align="center" width="200px" | '''Electron Holography''' [[image:Microscopy-icon_red.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/Technique/Holo|Holography ]] | ||
| align="center" width="200px" | '''Diffraction''' [[image:Microscopy-icon_red.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/Technique/Diffraction|Diffraction ]] | |||
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| align="center" width="200px" heigth="250px" | '''Available software at DTU Nanolab''' [[image: | | align="center" width="200px" heigth="250px" | '''Available software at DTU Nanolab''' [[image:Data_measure.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/Postprocessing|Available software ]] | ||
| align="center" width="200px" heigth="250px" | '''Lattice fringe analysis''' [[image: | | align="center" width="200px" heigth="250px" | '''Lattice fringe analysis''' [[image:Data_statistic.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/Postprocessing/Lattice fringes|Lattice fringes ]] | ||
| align="center" width="200px" heigth="250px" | '''Remote Access for Staff''' [[image:Data_laptop.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/Postprocessing/Remote_access|Remote access to the microscopes for DTU Nanolab staff ]] | |||
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Latest revision as of 09:09, 27 June 2023
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This section is written by DTU Nanolab internal if nothing else is stated.
Electron Microscopy at DTU Nanolab building 314/307
What kind of microscopes are available?
At DTU Nanolab - building 314/307 are different types of microscopes available:
Transmission Electron Microscopy (TEM) | Scanning Electron Microscopy (SEM) | Dual-beam Electron Microscopy - FIB-SEM and PFIB-SEM |
Which techniques are available?
Depending on the equipment, different techniques are available:
What to do with the data?
Available software at DTU Nanolab | Lattice fringe analysis | Remote Access for Staff |