LabAdviser/314/Microscopy 314-307: Difference between revisions
< LabAdviser | 314
m Jenk moved page LabAdviser:314/Microscopy 314-307 to LabAdviser/314/Microscopy 314-307 |
No edit summary |
||
(32 intermediate revisions by the same user not shown) | |||
Line 1: | Line 1: | ||
<span style="background:#FF2800">THIS PAGE IS UNDER CONSTRUCTION</span>[[image:Under_construction.png|200px]] | '''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/Microscopy_314-307 click here]''' | ||
<!-- <span style="background:#FF2800">THIS PAGE IS UNDER CONSTRUCTION</span>[[image:Under_construction.png|200px]] --> | |||
''This section is written by DTU Nanolab internal if nothing else is stated.'' | |||
[[Category:314]] | |||
[[Category:314-Microscopy]] | |||
= Electron Microscopy at DTU Nanolab building 314/307 = | |||
== What kind of microscopes are available? == | |||
At DTU Nanolab - building 314/307 are different types of microscopes available: | |||
{| border="0" cellspacing="100" style="margin: auto;" | |||
{| border="0" cellspacing=" | |||
|+ | |+ | ||
| align="center" width="200px" heigth="250px" | ''' | | align="center" width="200px" heigth="250px" | '''Transmission Electron Microscopy (TEM)''' [[image:Microscopy-icon_TEM.png|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/TEM|TEM ]] | ||
| align="center" width="200px" | ''' | | align="center" width="200px" | '''Scanning Electron Microscopy (SEM)''' [[image:Microscopy-icon_SEM.png|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/SEM|SEM ]] | ||
| align="center" width="200px" | ''' | | align="center" width="200px" | '''Dual-beam Electron Microscopy - FIB-SEM and PFIB-SEM''' [[image:Microscopy-icon_FIB.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/FIB|FIB ]] | ||
|} | |} | ||
== Which techniques are available? == | |||
Depending on the equipment, different techniques are available: | |||
{| border="0" cellspacing="75" | {| border="0" cellspacing="75" style="margin: auto;" | ||
|+ | |+ | ||
| align="center" width="200px" heigth="250px" | ''' | | align="center" width="200px" heigth="250px" | '''X-Ray spectroscopy (EDS/WDS)''' [[image:Microscopy-icon_red.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy 314-307/Technique/X-ray_spectroscopy|EDS/WDS ]] | ||
| align="center" width="200px" | ''' | | align="center" width="200px" | '''Electron Energy Loss Spectroscopy (EELS)''' [[image:Microscopy-icon_red.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/Technique/EELS|EELS ]] | ||
| align="center" width="200px" | '''Nova''' [[image:Microscopy- | | align="center" width="200px" | '''Energy Filtered TEM (EFTEM)''' [[image:Microscopy-icon_red.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy 314-307/Technique/EFTEM|EFTEM ]] | ||
|+ | |||
<!-- | align="center" width="200px" | '''Electron Backscatter Diffraction and Transmission Kikuchi Diffraction (EBSD/TKD)''' [[image:Microscopy-icon_red.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/Technique/EBSD-TKD|EBSD/TKD ]] --> | |||
| align="center" width="200px" | '''Electron Backscatter Diffraction and Transmission Kikuchi Diffraction (EBSD/TKD)''' [[image:Microscopy-icon_red.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/SEM/Nova/Transmission Kikuchi diffraction|EBSD/TKD ]] | |||
| align="center" width="200px" | '''Electron Holography''' [[image:Microscopy-icon_red.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/Technique/Holo|Holography ]] | |||
| align="center" width="200px" | '''Diffraction''' [[image:Microscopy-icon_red.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/Technique/Diffraction|Diffraction ]] | |||
|} | |} | ||
== What to do with the data? == | |||
{| border="0" cellspacing="75" style="margin: auto;" | |||
{| border="0" cellspacing=" | |||
|+ | |+ | ||
| align="center" width="200px" | ''' | | align="center" width="200px" heigth="250px" | '''Available software at DTU Nanolab''' [[image:Data_measure.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/Postprocessing|Available software ]] | ||
| align="center" width="200px" heigth="250px" | '''Lattice fringe analysis''' [[image:Data_statistic.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/Postprocessing/Lattice fringes|Lattice fringes ]] | |||
| align="center" width="200px" heigth="250px" | '''Remote Access for Staff''' [[image:Data_laptop.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/Postprocessing/Remote_access|Remote access to the microscopes for DTU Nanolab staff ]] | |||
|} | |} | ||
Latest revision as of 09:09, 27 June 2023
Feedback to this page: click here
This section is written by DTU Nanolab internal if nothing else is stated.
Electron Microscopy at DTU Nanolab building 314/307
What kind of microscopes are available?
At DTU Nanolab - building 314/307 are different types of microscopes available:
Transmission Electron Microscopy (TEM) | Scanning Electron Microscopy (SEM) | Dual-beam Electron Microscopy - FIB-SEM and PFIB-SEM |
Which techniques are available?
Depending on the equipment, different techniques are available:
What to do with the data?
Available software at DTU Nanolab | Lattice fringe analysis | Remote Access for Staff |