Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300/IBE Ti etch: Difference between revisions
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==Results from the acceptance test in February 2011== | ==Results from the acceptance test in February 2011== | ||
'''Acceptance test for Ti etch:''' | '''Acceptance test for Ti etch :''' | ||
{| border="2" cellspacing="0" cellpadding="2" | {| border="2" cellspacing="0" cellpadding="2" | ||
|- | |- | ||
| Line 12: | Line 15: | ||
*50 mm SSP Si wafer | *50 mm SSP Si wafer | ||
*525 µm thick | *525 µm thick | ||
*Supplied by | *Supplied by Nanolab | ||
|. | |. | ||
|- | |- | ||
| Line 29: | Line 32: | ||
!style="background:silver; color:black" align="left" valign="top"|Features to be etched | !style="background:silver; color:black" align="left" valign="top"|Features to be etched | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
* | *300 nm - 3µm dots and lines + a square of 200µmx200µm | ||
|. | |. | ||
|- | |- | ||
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!style="background:silver; color:black" align="left" valign="top"|Etch rate | !style="background:silver; color:black" align="left" valign="top"|Etch rate | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*> | *>80 nm/min | ||
| | | | ||
* | *22 nm/min +- 0.3nm/min (one standard deviation) | ||
|- | |- | ||
!style="background:silver; color:black" align="left" valign="top"|Etch rate uniformity | !style="background:silver; color:black" align="left" valign="top"|Etch rate uniformity | ||
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*+-(0.8% +-0.5%) | *+-(0.8% +-0.5%) | ||
|- | |- | ||
!style="background:silver; color:black" align="left" valign="top"|Selectivity ( | !style="background:silver; color:black" align="left" valign="top"|Selectivity (Ti etch rate/ZEP etch rate) | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*At least 1:1 | *At least 1:1 | ||
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{| border="2" cellspacing="2" cellpadding="3" | {| border="2" cellspacing="2" cellpadding="3" | ||
!Parameter | !Parameter | ||
! | !Ti etch acceptance | ||
|- | |- | ||
| | |Neutralizer current [mA] | ||
|550 | |550 | ||
|- | |- | ||
|RF Power [W] | |RF Power [W] | ||
| | |1200 | ||
|- | |- | ||
|Beam current [mA] | |Beam current [mA] | ||
| Line 91: | Line 94: | ||
|- | |- | ||
|Ar flow to neutralizer [sccm] | |Ar flow to neutralizer [sccm] | ||
| | |6.0 | ||
|- | |- | ||
|Ar flow to beam [sccm] | |Ar flow to beam [sccm] | ||
| | |6.0 | ||
|- | |- | ||
|Rotation speed [rpm] | |Rotation speed [rpm] | ||
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|- | |- | ||
|Stage angle [degrees] | |Stage angle [degrees] | ||
| | |20 | ||
|- | |- | ||
|} | |} | ||
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===Some SEM profile images of the etched | ===Some SEM profile images of the etched Ti=== | ||
{| border="1" cellspacing="1" cellpadding="2" | {| border="1" cellspacing="1" cellpadding="2" | ||
! | ! | ||
Revision as of 15:45, 6 February 2023
Feedback to this page: click here
The content on this page, including all images and pictures, was created by Berit Herstrøm @ DTU Nanolab (BGHE), unless otherwise stated.
Results from the acceptance test in February 2011
Acceptance test for Ti etch :
| . | Acceptance Criteria |
Acceptance Results |
|---|---|---|
| Substrate information |
|
. |
| Material to be etched |
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. |
| Mask information |
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. |
| Features to be etched |
|
. |
| Etch depth |
|
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| Etch rate |
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| Etch rate uniformity |
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| Reproducibility |
|
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| Selectivity (Ti etch rate/ZEP etch rate) |
|
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| Etch profile |
|
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Process parameters for the acceptance test
| Parameter | Ti etch acceptance |
|---|---|
| Neutralizer current [mA] | 550 |
| RF Power [W] | 1200 |
| Beam current [mA] | 500 |
| Beam voltage [V] | 600 |
| Beam accelerator voltage | 400 |
| Ar flow to neutralizer [sccm] | 6.0 |
| Ar flow to beam [sccm] | 6.0 |
| Rotation speed [rpm] | 20 |
| Stage angle [degrees] | 20 |


