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While electroplating in the 0-degree tilt position, air bubbles were caught in the system and were not able to escape.
 
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While electroplating in the 0-degree tilt position, air bubbles were caught in the system and were not able to escape.
While electroplating in the 0-degree tilt position, air bubbles were caught in the system and were not able to escape. Consequently some areas on the wafer were not deposited with copper.

Latest revision as of 10:20, 26 June 2015

While electroplating in the 0-degree tilt position, air bubbles were caught in the system and were not able to escape. Consequently some areas on the wafer were not deposited with copper.

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current10:19, 26 June 2015Thumbnail for version as of 10:19, 26 June 2015861 × 661 (154 KB)Lynhen (talk | contribs)While electroplating in the 0-degree tilt position, air bubbles were caught in the system and were not able to escape.

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