| Display title | File:Eves dep rate of SiO2 vs RF bias and temperature.png |
| Default sort key | Eves dep rate of SiO2 vs RF bias and temperature.png |
| Page length (in bytes) | 8 |
| Namespace ID | 6 |
| Namespace | File |
| Page ID | 5891 |
| Page content language | en - English |
| Page content model | wikitext |
| Indexing by robots | Allowed |
| Number of redirects to this page | 0 |
| Hash value | 79d99822ba907ce89f74cfbfe98eed4122386645 |
| Edit | Allow all users (infinite) |
| Move | Allow all users (infinite) |
| Upload | Allow all users (infinite) |
| Page creator | Eves (talk | contribs) |
| Date of page creation | 17:57, 9 August 2021 |
| Latest editor | Eves (talk | contribs) |
| Date of latest edit | 17:57, 9 August 2021 |
| Total number of edits | 1 |
| Total number of distinct authors | 1 |
| Recent number of edits (within past 90 days) | 0 |
| Recent number of distinct authors | 0 |
