Specific Process Knowledge/Characterization/XRD/XRD SmartLab/Instrumental broading in T2T: Revision history

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12 August 2024

31 July 2024

  • curprev 08:4208:42, 31 July 2024‎ Eves talk contribs‎ 51,510 bytes +564‎ No edit summary
  • curprev 08:4008:40, 31 July 2024‎ Eves talk contribs‎ 50,946 bytes +50,946‎ Created page with " This page describes the values of instrumental broadening in θ/2θ measurements and can be used as a reference for peak broadening in grain size calculation. The most common slit configuration cases are chosen, both with and without the Ge220 monochromator. The instrumental broadening has been measured by using standard Si and LaB<sub>6</sub> powder. Scherrer formula: <math>D=\frac{K\cdot\lambda}{\beta_{sample}\cdot cos\theta}</math> where: K is Scherrer constant..."
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