View source for LabAdviser/314/Microscopy 314-307/SEM

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[[Category:314]]
[[Category:314-Microscopy]]

= SEM =

Scanning Electron Microscopy (SEM) is a technique, where a focused beam of accelerated electrons is scanning over a sample. Electrons which are backscattered or secondar generated electrons are collected on a detector. Dependenging on the type of detector, different signals and sample characteristics can be acquired. The electron beam is steered by electromagnetic lenses.


We have four SEMs available at DTU Nanolab. Click on the instrument to find more information about the equipment and available techniques:

{| border="0" cellspacing="75" style="margin: auto;"
|+
| align="center" width="200px" heigth="250px" | '''Nova''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/SEM/Nova|Nova ]]
| align="center" width="200px" | '''QFEG''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy_314-307/SEM/QFEG|QFEG ]]
| align="center" width="200px" | '''AFEG''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy_314-307/SEM/AFEG|AFEG ]]
| align="center" width="200px" | '''Helios''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy_314-307/FIB/Helios|Helios ]]
|}


== Comparison between SEMs at DTU Nanolab - building 314/307 ==

{{SEM comparison table 314}}