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The SEM LEO has been decomissioned and relocated to DTU Mechanics in 2020.

SEM LEO

The SEM LEO located in cleanroom F-2

The SEM LEO was a very reliable and rugged instrument that provided high quality SEM images of most samples and it served the users of the cleanroom for many years. Excellent images on a large variety of materials such as semiconductors, semiconductor oxides or nitrides, metals, thin films and some polymers were acquired by the thousands on the SEM.

In her later years the SEM LEO was equipped with a Raith e-beam lithography system and was exclusively dedicated to the users of the Raith E-beam lithography.

Typical current values for EBL

Reported values are the average of five measurements from Elphy Quantum using the EBL holder's Faraday cup. All values in pA.

	5kV	10kV	15kV	20kV
LEO - Current measurements 11/02/2017
10um	13	17	20.5	25
20um	62	87	105	127
30um	160	175	215	264
60um	510	680	850	1040

Equipment performance

Equipment		SEM LEO (Leo 1550 SEM)
Purpose	Imaging and measurement of	Conducting samples Semi-conducting samples Thin (~ 5 µm <) layers of non-conducting materials such as polymers
Purpose	Other purpose	E-beam lithography using Raith Elphy Quantum system
Location		Cleanroom of DTU Nanolab
Performance	Resolution	~ 5 nm (limited by vibrations) The resolution is strongly dependent on the type of sample and the skills of the operator.
Instrument specifics	Detectors	Secondary electron (Se2) Inlens secondary electron (Inlens) Backscatter electron (BSD)
	Stage	X, Y: 125 × 100 mm T: 0 to 90^o R: 360^o Z: 48 mm
	Electron source	FEG (Field Emission Gun) source
	Operating pressures	Fixed at High vacuum (2 × 10^-5mbar - 10^-6mbar)
	Options	Raith Elphy Quantum E-Beam Litography system
Substrates	Batch size	Wafers up to 6" (only full view up to 4")
	Allowed materials	Any standard cleanroom materials.