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Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy

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< Specific Process Knowledge | Characterization

Revision as of 20:20, 22 November 2007 by Jml (talk | contribs) (→[[/FEI|FEI SEM]] - ''FEI Nova 600 NanoSEM'')

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At the moment we have three SEM's.

FEI SEM - FEI Nova 600 NanoSEM

Technical specifications

LEO SEM

JEOL SEM

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