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LabAdviser/Technology Research/Nanoscale characterization of ultra-thin metal films for nanofabrication applications: Difference between revisions

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*; In-depth evolution of chemical states and sub-10-nm-resolution crystal orientation mapping of nanograins in Ti(5 nm)/Au(20 nm)/Cr(3 nm) trilayer thin films  
*; In-depth evolution of chemical states and sub-10-nm-resolution crystal orientation mapping of nanograins in Ti(5 nm)/Au(20 nm)/Cr(3 nm) trilayer thin films  
*: [[File:2.jpg|300px]]
*: [[:File:3.jpg|300px]]
*: [https://www.sciencedirect.com/science/article/pii/S0169433218313187 Link to Article]
*: [https://www.sciencedirect.com/science/article/pii/S0169433218313187 Link to Article]
*: A. B. da Silva Fanta, <u>M. Todeschini</u>, A. Burrows, H. Jansen, C. D. Damsgaard, H. Alimadadi, and J. B. Wagner<br> ''Materials Characterization'', vol. 139, pp. 452-462, 2018.
*: X. Zhu, <u>M. Todeschini</u>, A. B. da Silva Fanta, L. Liu, F. Jensen, J. Hübner, H. Jansen, A. Han, P. Shi, A. Ming, and C. Xie<br> ''Applied Surface Science'', vol. 453, pp. 365-372, 2018.
** '''Overview:''' [[/SEM-LEO Customizations for Organic Ice Resists|SEM-LEO Customizations for Organic Ice Resists]]