Jump to content

LabAdviser/Technology Research/Nanoscale characterization of ultra-thin metal films for nanofabrication applications: Difference between revisions

Mattod (talk | contribs)
Mattod (talk | contribs)
Line 33: Line 33:
*; Elevated temperature transmission Kikuchi diffraction in the SEM  
*; Elevated temperature transmission Kikuchi diffraction in the SEM  
*: [[File:2.jpg|300px]]
*: [[File:2.jpg|300px]]
*: [https://doi.org/10.1016/j.mee.2018.01.021 Link to Article]
*: [https://www.sciencedirect.com/science/article/pii/S1044580318300937 Link to Article]
*: A. B. da Silva Fanta, <u>M. Todeschini</u>, A. Burrows, H. Jansen, C. D. Damsgaard, H. Alimadadi, and J. B. Wagner<br> ''Materials Characterization'', vol. 139, pp. 452-462, 2018.
*: A. B. da Silva Fanta, <u>M. Todeschini</u>, A. Burrows, H. Jansen, C. D. Damsgaard, H. Alimadadi, and J. B. Wagner<br> ''Materials Characterization'', vol. 139, pp. 452-462, 2018.
** '''Overview:''' [[/SEM-LEO Customizations for Organic Ice Resists|SEM-LEO Customizations for Organic Ice Resists]]
** '''Overview:''' [[/SEM-LEO Customizations for Organic Ice Resists|SEM-LEO Customizations for Organic Ice Resists]]